Publications of Johan Schoukens

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Complete list of publications

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  1. High-Accuracy Spectrum Analysis of Sampled Discrete Frequency Signals by Analytical Leakage Compensation
    Renders H., Schoukens J., Vilain G.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-33, No. 4, December, 1984, pp. 287-292.
  2. Modeling the Noise Influence on the Fourier Coefficients after a Discrete Fourier Transform
    Schoukens J., Renneboog J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-35, No. 3, September, 1986, pp. 278-286.
  3. A maximum likelihood estimator for linear and nonlinear systems-apractical application of estimation techniques in measurement problems
    Schoukens, J.   Pintelon, R.   Renneboog, J
    IEEE Transactions on Instrumentation and Measurement, Vol. 37, No. 1, March, 1988, pp. 10–17
  4. Peak Factor Minimization Using a Time-Frequency Domain Swapping Algorithm
    Van der Ouderaa E., Schoukens J., Renneboog J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 37, No. 1, March, 1988, pp. 145-147
  5. The Geometric Mean of Power (amplitude) Spectra has a Much Smaller Bias than the Classical Arithmetic (RMS) Averaging
    Pintelon R., Schoukens J., Renneboog J.
    IEEE Transactions on Instrumentation and Measurement, June, 1988, Vol. 37, pp. 213–218
  6. Peak Factor Minimization of Input and Output Signals of Linear Systems
    Van der Ouderaa E., Schoukens J., Renneboog J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 37, No. 2, June, 1988, pp. 207–212
  7. Survey of Excitation Signals for F.F.T. Based Signal Analyzers
    Schoukens J., Pintelon R., Van der Ouderaa E., Renneboog J.
    IEEE Transactions on Instrumentation and Measurement, September, 1988, Vol. 37, No. 3, pp. 342–351
  8. Sensitivity of Roots to Errors in the Coefficients of Polynomials obtained by Frequency Domain Estimation Methods
    Guillaume P., Schoukens J., Pintelon R.
    IEEE Transactions on Instrumentation and Measurement, December, 1989,Vol. IM-38, No. 6, pp. 1050–1056
  9. Towards an Ideal Data Acquisition Channel
    Pintelon R., Rolain Y., Vanden Bossche M., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, February, 1990, Vol. IM-39, No. 1, pp. 116–120
  10. Group Delay Measurements of a Transmission Line Using Single Channel Measurements
    Van Wassenhove D., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, February, 1990, Vol. 39, No. 1, pp. 180–183
  11. Design and Implementation of a Fast Logarithmic Stepped Sine for a Fixed Sample Rate Digital Network Analyser
    Rolain Y., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 39, No. 1, February, 1990, pp. 151–156
  12. Robust Identification of Transfer Functions in the s- and z-Domains
    Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 39, No. 4, August, 1990, pp. 565–573
  13. On the use of Signals with a Constant Signal-to-Noise Ratio in the Frequency-Domain
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 835–842
  14. Amplitide-Only versus Amplitude-Phase Estimation
    Rolain Y., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 818–823
  15. Optimal FIR and IIR Hilbert Transformer Design Via LS and Minimax Fitting
    Kollár I., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 847–852
  16. Parameter Estimation in Strongly Nonlinear Circuits
    Van Den Eijnde E., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 853–859
  17. Measurement of Frequency Response Functions in Noisy Environments
    Schoukens J., Pintelon R.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 905–909
  18. Real-Time Integration and Differentiation of Analog Signals by Means of Digital Filtering
    Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 923–927
  19. Correspondence : Another Step Towards an Ideal Data Acquisition Channel
    Kollár I., Pintelon R., Rolain Y., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-40, No. 3, June, 1991, pp. 659–660
  20. Crest-Factor Minimization Using Nonlinear Chebyshev Approximation Methods
    Guillaume P., Schoukens J., Pintelon R., Kollár I.
    IEEE Transactions on Instrumentation and Measurement, Vol. 40, No. 6, December, 1991, pp. 982–989
  21. Parametric Identification of Two-Port Models in the Frequency Domain
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, IM-41, No. 2, April, 1992, pp. 233–239
  22. The Interpolated Fast Fourier Transform : A Comparative Study
    Schoukens J., Pintelon R., Van hamme H.
    IEEE Transactions on Instrumentation and Measurement, IM-41, No. 2, April, 1992, pp. 226–232
  23. Non-parametric Frequency Response Functions Estimators Based on Nonlinear Averaging Techniques
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-41, No. 6, December, 1992, pp. 739-746
  24. Identification of Linear Dynamic Systems Using Piecewise Constant Excitations: Use, Misuse and Alternatives
    Schoukens J., Pintelon R., Van hamme H.
    Automatica, Vol. 30, No. 7, 1994, pp. 1153–1169
  25. Quantifying Model Errors of Identified Transfer Functions
    Schoukens J., Pintelon R.
    IEEE Transactions on Automatic Control, Vol. 39, No. 8, August 1994, pp. 1733–1737
  26. Parametric Identification of Transfer Functions in the Frequency Domain—A Survey
    Pintelon R., Guillaume P., Rolain Y., Schoukens J., Van Hamme H.
    IEEE Transactions on Automatic Control, Vol. 39, No. 11, November 1994, pp. 2245–2260
  27. Robust parametric transfer function estimation using complex logarithmic frequency response data
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Automatic Control, Vol. 40, No. 7, July 1995, pp. 1180–1190
  28. A Critical Note on Histogram Testing of Data Acquisition Channels
    Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 44, No. 4, August 1995, pp. 860–863
  29. Measurement of Noise (Cross-)Power Spectra for Frequency-Domain System Identification Purposes: Large-Sample Results
    Pintelon R., Guillaume P. and Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-44, no 1, February 1996, pp. 12–21
  30. An Improved Sine-wave Fitting Procedure for Characterizing Data Acquisition Channels
    Pintelon R. and Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-45, No. 2, April 1996, pp. 588–593
  31. On the Use of System Identification for Accurate Parametric Modelling of Non-Linear Systems using Noisy Measurements
    Vandersteen G., Rolain Y., Schoukens J. and Pintelon R.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-45, No. 2, April 1996, pp. 605-609
  32. Study of the Influence of Clock Instabilities in Synchronized data Acquisition Systems
    Schoukens J., Louage F., Rolain Y.
    IEEE Transactions on Instrumentation and Measurement, Vol. 45, No. 2, April 1996, pp. 601–604
  33. Minimum Variance Bounds for Overparametrized Models
    Pintelon R., Schoukens J. and Rolain Y.
    IEEE Transactions on Automatic Control, 1996, Vol. AC-41, No. 5, May 1996, pp. 719–720
  34. Design of Stable IIR Filters in the Complex domain by Automatic Delay Selection
    Vuerinckx R., Rolain Y., Schoukens J., Pintelon R.
    IEEE Transactions on Signal Processing, Vol. 44, No. 9, September 1996, pp. 2339–2344
  35. Non-parametric Estimation of the Frequency Response Functions of the Linear Blocks of a Wiener-Hammerstein Model
    G. Vandersteen, Y. Rolain and J. Schoukens
    Automatica, Vol. 33, No. 7, 1997, pp. 1351-1355
  36. Frequency–Domain Identification of Linear Time–Invariant Systems Under Nonstandard Conditions
    Pintelon R. and Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 46, No. 1, February 1997, pp. 65–71
  37. Model Selection through a Statistical Analysis of the Global Minimum of a Weighted Nonlinear Least Squares Cost Function
    Pintelon R., Schoukens J. and Vandersteen G.
    IEEE Transactions on Signal Processing, Vol. 45, No. 3, March 1997, pp. 686-693
  38. An Improved Sliding-Load Calibration Procedure Using an Semiparametric Circle-Fitting Procedure
    Gerd Vandersteen, Yves Rolain, Johan Schoukens and Ann Verschueren
    IEEE Transactions on Microwave Theory and Techniques, Vol. 45, No. 7, July 1997, pp. 1027-1033
  39. A Sinewave Fitting Procedure for Characterizing Data Acquisition Channels in the presence of Time Base Distortions and Time Jitter
    Schoukens J., R. Pintelon and G. Vandersteen
    IEEE Transactions on Instrumentation and Measurement, Vol. 46, No. 4, August 1997, pp. 1005–1010
  40. Order Estimation for Linear Time-Invariant Systems using Frequency Domain Identification Methods
    Y. Rolain, J. Schoukens and R. Pintelon.
    IEEE Transactions on Automatic Control, Vol. 42, No. 10, October 1997, pp. 1408–1417
  41. Frequency Domain System Identification Using Arbitrary Signals
    R. Pintelon, J. Schoukens and G. Vandersteen
    IEEE Transactions on Automatic Control, Vol. 42, No. 12, December 1997, pp. 1717–1720
  42. Improved Frequency Response Function Measurements for Random Noise Excitations
    Johan Schoukens, Yves Rolain and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 47, No. 1, February 1998, pp. 322–326
  43. Parametric and Nonparametric Identification of Linear Systems in the Presence of Nonlinear Distortions—A frequency Domain Approach
    Johan Schoukens, Tadeusz Dobrowiecki and Rik Pintelon
    IEEE Transactions on Automatic Control, Vol. 43, No. 2, February 1998, pp. 176–190
  44. Signal Reconstruction for Non-Equidistant Finite Length Sample Sets: a “KIS” approach
    Yves Rolain, Johan Schoukens and Gerd Vandersteen
    IEEE Transactions on Instrumentation and Measurement, Vol. 47, No. 5, October 1998, pp. 1046–1052
  45. Time series Analysis in the Frequency Domain
    Rik Pintelon and Johan Schoukens
    IEEE Transactions on Signal Processing, Vol. 47, No. 1, January 1999, pp. 206–210
  46. Frequency-Domain Identification of Linear Systems Using Arbitrary Excitations and a Nonparametric Noise Model
    J. Schoukens, G. Vandersteen, R. Pintelon and P. Guillaume
    IEEE Transactions on Automatic Control, Vol. 44, No. 2, February 1999, pp. 343–347
  47. Identification of Invariants of (Over)Parameterized Models: Finite Sample Results
    R. Pintelon, J. Schoukens, G. Vandersteen and Y. Rolain
    IEEE Transactions on Automatic Control, Vol. 44, No. 5, May 1999, pp. 1073–1077
  48. Measurement and identification of nonlinear system consisting out of linear dynamic blocks and one static nonlinearity
    G. Vandersteen and J. Schoukens
    IEEE Transactions on Automatic Control, Vol. 44, No. 6, June 1999, pp. 1266-1271
  49. Identification of Continuous-Time Systems with Missing Data
    R. Pintelon and J. Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 48, No. 3, June 1999, pp. 736–740
  50. Frequency Domain System Identification with Missing Data
    R. Pintelon and J. Schoukens
    IEEE Transactions on Automatic Control, Vol. 45, No. 2, February 2000, pp. 364–369
  51. Learning Neural Networks with Noisy Inputs Using the Errors-in-Variables Approach
    Jürgen Van Gorp, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Neural Networks, Vol. 11, No. 2, March 2000, pp. 402–414
  52. Robust Broadband Periodic Excitation Design
    Gyula Simon and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 49, No. 2, April 2000, pp. 270–274
  53. Broadband versus Stepped Sine FRF Measurements
    J. Schoukens, R. Pintelon and Y. Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 49, No. 2, April 2000, pp. 275–278
  54. Practical Choices in the FRF Measurement in Presence of Nonlinear Distortions
    Tadeusz P. Dobrowiecki and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 1, February 2001, pp. 2–7
  55. Obtaining Accurate Confidence Regions for the Estimated Zeros and Poles in System Identification Problems
    R. Vuerinckx, R. Pintelon, J. Schoukens and Y. Rolain
    IEEE Transactions on Automatic Control, Vol. 46, No. 4, pp. 656-659, April 2001
  56. Identification of Linear Systems in the Presence of Nonlinear Distortions
    R. Pintelon, J. Schoukens, W. Van Moer and Y. Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 4, August 2001, pp. 855-863
  57. Design of Multisine Excitations to Characterize the Nonlinear Distortions During FRF-measurements
    K. Vanhoenacker, T. Dobrowiecki and J. Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 5, October 2001, pp. 1097–1102
  58. An Identification Technique for Data Acquisition Characterization in the Presence of Nonlinear Distortions and Time Base Distortions
    Gerd Vandersteen, Yves Rolain, Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 5, October 2001, pp. 1355–1363
  59. Static Nonlinearity Testing of Digital-to-Analog Converters
    Balázs Vargha, Johan Schoukens and Yves Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 5, October 2001, pp. 1283-1288
  60. First Estimates of Wiener and Hammerstein Systems Using Multisine Excitation
    Philippe Crama, Johan Schoukens
    IEEE Transactions on Measurement and Instrumentation, Vol. 50, no. 6, December 2001, 1791-1795
  61. An Automatic Harmonic Selection Scheme for Measurements and Calibration With the Nonlinear Vectorial Network Analyzer
    Wendy Van Moer, Yves Rolain and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 2, April 2002, pp. 337-341
  62. Measurement and Modelling of Linear Systems in the Presence of Non-Linear Distortions
    R. Pintelon and J. Schoukens
    Mechanical Systems and Signal Processing (2002) 16(5), pp. 785-801
  63. Linear Modeling in the Presence of Nonlinear Distortions
    Johan Schoukens, Rik Pintelon and Tadeusz Dobrowiecki
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 4, August 2002, pp. 786-792
  64. Identification of Volterra Kernels Using Interpolation
    József G. Németh, István Kollár and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 4, August 2002, pp. 770-775 (2002 Andrew R. Chi Best Paper Award)
  65. An Efficient Nonlinear Least Square Multisine Fitting Algorithm
    Guyla Simon, Rik Pintelon, László Sujbert and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 4, August 2002, pp. 750-755
  66. Discussion on Fundamental Issues of NPR Measurements
    Alain Geens, Yves Rolain, Wendy Van Moer, Kenneth Vanhoenacker, Johan Schoukens
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, Vol. 52, No. 1, February 2003, pp. 197-202
  67. Detection of Nonlinear Distortions With Multisine Excitations in the Case of Nonideal Behavior of the Intput Signal
    Kenneth Vanhoenacker and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 3, June 2003, pp. 748-753
  68. Fully Automated Spectral Analysis of Periodic Signals
    J. Schoukens, Y. Rolain, G. Simon, R. Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 4, August 2003, pp. 1021-1024
  69. Why are Nonlinear Microwave systems Measurements so Involved?
    Yves Rolain, Wendy Van Moer, Gerd Vandersteen and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 3, June 2004, pp. 726-729
  70. Experimental Characterization of Operational Amplifiers: a System Identification Approach—Part I: Theory and Simulations
    R. Pintelon, G. Vandersteen, Ludwig De Locht, Y. Rolain and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 3, June 2004, pp. 854-862
  71. Experimental Characterization of Operational Amplifiers: a System Identification Approach—Part II: Calibration and Measurements
    R. Pintelon, Y. Rolain, G. Vandersteen and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 3, June 2004, pp. 863-876
  72. Linearization of nonlinear dynamic systems
    J. Schoukens, J. Nemeth, G. Vandersteen, R. Pintelon, P. Crama
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 4, August 2004, pp. 1245-1248
  73. Decoding non-linear growth rates in biogenic environmental archives
    Fjo De Ridder, Rik Pintelon, Johan Schoukens, David Paul Gillikin, Luc André, Willy Baeyens, Anouk de Brauwere and Frank Dehairs
    Geochemistry, Geophysics, Geosystems (G3), An Electronic Journal of the Earth Sciences, Published by AGU and the Geochemical Society, Volume 5, Number 12, 30 December, 2004
  74. Box-Jenkins alike identification using nonparametric noise models
    J. Schoukens, R. Pintelon, Y. Rolain
    Automatica 40 (2004), pp. 2083-2089
  75. Modified AIC and MDL Model Selection Criteria for Short Data Records
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and David Paul Gillikin
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 1, February 2005, pp. 144-150
  76. Computing an Initial Estimate of a Wiener-Hammerstein System With a Random Phase Multisine Excitation
    Philippe Crama and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 1, February 2005, pp. 117-122
  77. Reduction of the Gibbs Phenomenon Applied on Nonharmonic Time Base Distortions
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and Anouk Verheyden
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 3, June 2005, pp. 1118-1125
  78. Variance analysis of frequency response function measurements using periodic excitations
    T. D’haene, R. Pintelon, J. Schoukens and E. Van Gheem
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 4, August 2005, pp. 1452-1456
  79. Diffusion systems: stability, modeling and identification
    Pintelon R., J. Schoukens, L. Pauwels, and E. Van Gheem
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 5, October 2005, pp. 2061-2067
  80. Experimental Characterization of the Nonlinear Behavior of RF Amplifiers
    Yves Rolain, Wendy Van Moer, Rik Pintelon and Johan Schoukens
    IEEE Transactions on Microwave Theory and Techniques, Vol. 54, No. 8, August 2006, pp. 3209-3218
  81. On Parameter Estimation Using Nonparametric Noise Models
    Kaushik Mahata, Rik Pintelon and Johan Schoukens
    IEEE Transactions on Automatic Control, Vol. 51, No. 10, October 2006, pp. 1602-1612
  82. Leakage reduction in frequency response function measurements
    J. Schoukens, Y. Rolain, R. Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 6, December 2006, pp. 2286-2291
  83. Continuous-Time Noise Modeling From Sampled Data
    Rik Pintelon, Johan Schoukens and Patrick Guillaume
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 6, December 2006, pp. 2253-2258
  84. Optimized Excitation Signals for MIMO Frequency Response Function Measurements
    Tadeusz Dobrowiecki, Johan Schoukens, Patrick Guillaume
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 6, December 2006, pp. 2072-2079
  85. Linear Approximation of Weakly Nonlinear MIMO Systems
    Tadeusz P. Dobrowiecki, Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 3, June 2007, pp. 887-894
  86. Measuring Nonlinear Differential RF Amplifiers using one Single-Ended Source
    Yves Rolain, Wendy Van Moer, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 3, June 2007, pp. 1042-1048
  87. Fast Measurements of Quantization Distortions in DSP Algorithms
    Johan Paduart, Johan Schoukens and Yves Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 5, October 2007, pp. 1917-1923
  88. On the use of a crystal detector for a phase calibration of the large signal network analyzer
    Liesbeth Gommé, Johan Schoukens, Yves Rolain and Wendy Van Moer
    MEASUREMENT SCIENCE AND TECHNOLOGY, 19 (2008) 085104 (8pp)
  89. Blind maximum likelihood identification of Hammerstein systems
    L. Vanbeylen, R. Pintelon, J. Schoukens
    Automatica 44 (2008), pp. 3139-3146
  90. Estimation and Validation of Semiparametric Dynamic Nonlinear Models
    Yves Rolain, Wendy Van Moer, Johan Schoukens and Tom Dhaene
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 2, February 2008, pp. 395-400
  91. Frequency-Domain, Errors-in-Variables Estimation of Linear Dynamic Systems Using Data From Overlapping Subrecords
    Kurt Barbé, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 8, August 2008, pp. 1529-1536
  92. Identification of a Block-Structured Nonlinear Feedback System, Applied to a Microwave Crystal Detector
    Johan Schoukens, Liesbeth Gommé, Wendy Van Moer and Yves Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 8, August 2008, pp. 1734-1740
  93. Application of Blind Identification to Nonlinear Calibration
    Laurent Vanbeylen, Rik Pintelon and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 8, August 2008, pp. 1771-1778
  94. A Nonlinear Block Structure Identification Procedure Using Frequency Response Function Measurements
    Lieve Lauwers, Johan Schoukens, Rik Pintelon and Martin Enqvist
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 10, October 2008, pp. 2257-2264
  95. Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling
    Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens and Wendy Van Moer
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 2, February 2009, pp. 475-482
  96. Robustness Issues of the Best Linear Approximation of a Nonlinear System
    Johan Schoukens, John Lataire, Rik Pintelon, Gerd Vandersteen, and Tadeusz Dobrowiecki
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 5, May 2009, pp. 1737-1745
  97. Estimation of Nonparametric Noise Models for Linear Dynamic Systems
    Johan Schoukens and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 8, AUGUST 2009, pp. 2468-2474
  98. Blind maximum-likelihood identification of Wiener Systems
    Vanbeylen, L., R. Pintelon and J. Schoukens
    IEEE Transactions on Signal Processing, Vol. 57, No. 8, August 2009, pp. 3017-3029
  99. Optimal Settings for Measuring Frequency Response Functions with Weighted Overlapped Segment Averaging
    J. Antoni, J. Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 9, September 2009, pp 3276-3287
  100. Time domain model validation of a nonlinear block-oriented structure
    GOMME Liesbeth, ROLAIN YVES, SCHOUKENS JOANNES, PINTELON RIK
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2009 105106, vol. 20, n. 10, published by IOP Publishing Ltd
    (URL: http://www.iop.org/EJ/abstract/0957-0233/20/10/105106/)
  101. Two Nonlinear Optimization Methods for Black Box Identification Compared Reference
    Anne Van Mulders, Johan Schoukens, Marnix Volckaert , Moritz Diehl
    Automatica, Volume 46, Issue 10, October 2010, Pages 1675-1681
  102. On the Polynomial Approximation for Time-Variant Harmonic Signal Modeling
    Miroslav Zivanovic and Johan Schoukens
    IEEE Transactions on Audio, Speech and Language Processing, Vol. 19, No. 3, 2010, pp. 458-467
  103. Estimation of nonparametric noise and FRF models for multivariable systems—Part I: Theory
    R. Pintelon, J. Schoukens, G. Vandersteen, K. Barbé
    Mechanical Systems and Signal Processing 24 (2010) 573–595
  104. Estimation of nonparametric noise and FRF models for multivariable systems—Part II: Extensions, applications
    R. Pintelon, J. Schoukens, G. Vandersteen, K. Barbé
    Mechanical Systems and Signal Processing 24 (2010) 596–616
  105. Upper Bounding Variations of Best Linear Approximations of Nonlinear Systems in Power Sweep Measurements
    J. Schoukens, T. Dobrowiecki, Y. Rolain, R. Pintelon
    IEEE Transactions on Instrumentation and Measurement, May 2010, Vol. 59, No. 5, pp. 1141-1148
  106. Improved (non-)parametric identification of dynamic systems excited by periodic signals—The multivariate case
    R. Pintelon, G. Vandersteen, J. Schoukens, Y. Rolain
    Mechanical Systems and Signal Processing, Vol. 25, No. 8 (2011) pp. 2892–2922
  107. The Use of Nonparametric Noise Models Extracted From Overlapping Subrecords for System Identification
    Kurt Barbé, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Signal Processing, Vol. 59, No. 10, October 2011, pp. 4635-4647
  108. Optimal multisine excitation design for broadband electrical impedance spectroscopy
    B. Sanchez, G. Vandersteen, R. Bragos and J. Schoukens
    Measurement Science and Technology, Vol. 22, No. 11, November 2011, 115601 (11pp)
UP

Conference papers (download)

  1. Minimum variance bounds for overparametrized models
    R. Pintelon, Schoukens J. and Rolain Y.
    Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15, 1995, pp. 1815-1816
  2. Order estimation for linear time-invariant systems using frequency domain identification methods
    Rolain Y., Schoukens J., and Pintelon R.
    Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15 1995, pp. 3588-3593
  3. Identification of linear systems in the presence of nonlinear distortions A frequency domain approach Part I: Non-parametric identification
    Schoukens J., Dobrowiecki T. and R. Pintelon
    Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15, 1995, pp. 1216-1221
  4. Identification of linear systems in the presence of nonlinear distortions A frequency domain approach Part II: Parametric identification
    Schoukens J., Dobrowiecki T. and R. Pintelon
    Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15, 1995, pp. 1222-1227
  5. A Circle Fitting Procedure using Semi-Parametric modelling: Toward an Improved Sliding Load Calibration Procedure
    Gerd Vandersteen, Johan Schoukens, Yves Rolain and Ann Verschueren
    Conference Proceedings of the IEEE Instrumentation and Measurement Technology Conference (IMTC-IMEKO TC-7), Brussels (Belgium), June 4-6, 1996, pp. 1254–1258
  6. Model Selection Through a Statistical Analysis of the Global Minimum of a Weighted Non-Linear Least Squares Cost Function
    R. Pintelon, J. Schoukens and G. Vandersteen
    Proceedings of the 35th Conference on Decision and Control, Kobe, Japan, December 11-13, 1996, pp. 3100-3106
  7. Frequency Domain System Identfication Using Arbitrary Signals
    R. Pintelon, J. Schoukens and G. Vandersteen
    Proceedings of the 35th Conference on Decision and Control, Kobe, Japan, December 11-13, 1996, pp. 2048-2051
  8. Measurement and identification of nonlinear system consisting out of linear dynamic blocks and one static nonlinearity
    G. Vandersteen and J. Schoukens
    IEEE Instrumentation and Measurement, Technology Conference, Ottawa, Canada, May 19-21 1997, pp. 853-858
  9. Study of conditional MLE in time and frequency domain system identification
    J. Schoukens, R. Pintelon and Y. Rolain
    European Control Conference, ECC 97, Brussels, Belgium, July 1-4, 1997, Vol. 5, TH-E F6
  10. GTLS Algorithms in the Frequency Domain System Identification using Noise Information out of A Finite Number of Repeated Independent Realizations
    Gerd Vandersteen, Rik Pintelon and Johan Schoukens
    European Control Conference, ECC 97, Brussels, Belgium, July 1-4, 1997, Vol. 4, TH-M-F5
  11. System Identification for Data Acquisition Characterization
    Gerd Vandersteen, Yves Rolain and Johan Schoukens
    IEEE Instrumentation and Measurement Technology Conference, St. Paul, USA, May 18-21, 1998
  12. Adding Input Noise to Increase the Generalization of Neural Networks is a Bad Idea
    Van Gorp Jürgen, Schoukens Johan, Pintelon Rik
    ANNIE 1998, Intelligent Engineering Systems Through Artificial Neural Networks, Volume 8, pp. 127 - 132
  13. The Errors-In-Variables Cost Function for Learning Neural Networks with Noisy Inputs
    Van Gorp Jürgen, Schoukens Johan, Pintelon Rik
    ANNIE 1998, Intelligent Engineering Systems Through Artificial Neural Networks, Volume 8, pp. 141 - 146
  14. Best conditioned Common Denominator Transfer Function Matrix Estimation in the Frequency Domain
    Y. Rolain, G. Vandersteen and J. Schoukens
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 3938-3939
  15. Frequency Domain System Identification with Missing Data
    R. Pintelon and J. Schoukens
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 701-705
  16. Fast Calculation of Least-Squares Estimates for System Identification
    J. Schoukens, Y. Rolain, F. Gustafsson and R. Pintelon
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 3408-3410
  17. Frequency Domain Identification of Linear Systems Using Arbitrary Excitations and a Nonparametric Noise Model
    J. Schoukens, G. Vandersteen, R. Pintelon and P. Guillaume
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 3909-3913
  18. A Scheme for Nonlinear Modeling
    Van Gorp Jürgen, Schoukens Johan
    World Multiconference on Systemics, Cybernetics and Informatics (SCI ‚99), 5th International Conference on Information Systems Analysis and Synthesis (ISAS'99), July - August 1999, Orlando, U.S.A., Volume 5, pp. 450 - 456
  19. Frequency response function measurements in the presence of non-linear distortions. A general framework and practical advices
    J. Schoukens, R. Pintelon, Y. Rolain and T. Dobrowiecki
    Proceedings ISMA 25, Leuven, September 13-15, 2000, Noise and Vibration Engineering, Vol. 1, pp. 459-464
  20. The use of multisine excitations to characterize damage in structures
    K. Vanhoenacker, J. Schoukens, P. Guillaume and S. Vanlanduit
    Proceedings ISMA 25, Leuven, September 13-15, 2000, Noise and Vibration Engineering, Vol. 1, pp. 465-472
  21. Measurement and Modeling of Linear Systems in the Presence of Non-linear Distortions
    R. Pintelon and J. Schoukens
    Proceedings ISMA 25, Leuven, September 13-15, 2000, Noise and Vibration Engineering, Vol. 1, pp. 451-458
  22. Efficient Bit-Error-Rate Estimation of Multi-Carrier Transceivers
    Gerd Vandersteen, Piet Wambacq, Yves Rolain, Johan Schoukens
    Design, Automation and Test in Europe Conference, DATE 2001, Munich, Germany, 13-16 March 2001, pp. 164-168
  23. Measurement of Frequency Response Functions in the Presence of Correlated Input/Output Errors
    R. Pintelon, J. Schoukens
    IMTC/2001, Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Rediscovering Measurement in the Age of Informatics, Budapest, Hungary, May 21-23, 2001, Vol. 1, pp. 2-7
  24. Linear Modelling in the Presence of Nonlinear Distortions
    J. Schoukens, R. Pintelon and T. Dobrowiecki
    IMTC/2001, Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Rediscovering Measurement in the Age of Informatics, Budapest, Hungary, May 21-23, 2001, Vol. 2, pp. 1332-1338
  25. Discussion on Fundamental Issues of NPR Measurements
    Alain Geens, Yves Rolain, Kenneth Vanhoenacker, Johan Schoukens
    IMTC/2001, Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Rediscovering Measurement in the Age of Informatics, Budapest, Hungary, May 21-23, 2001, Vol. 1, pp. 160-165
  26. First Estimates of Wiener and Hammerstein Systems Using Multisine Excitation
    Philippe Crama, Johan Schoukens
    IMTC/2001, Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Rediscovering Measurement in the Age of Informatics, Budapest, Hungary, May 21-23, 2001, Vol. 2, pp. 1365-1369
  27. Separation of the nolinear source pull from the nonlinear system behaviour
    Ph. Crama, Y. Rolain, W. Van Moer and J. Schoukens
    57th ARFTG Conference Digest, 25 May 2001, Phoenix, AZ, pp. 53-59
  28. Wiener-Hammerstein System Estimator Initialisation Using a Random Multisine Excitation
    Philippe Crama and Johan Schoukens
    58th ARFTG Conference Digest, 29-30 November 2001, San Diego
  29. Nonparametric model error bounds for control design in the presence of nonlinear distortions
    J. Schoukens, R. Pintelon and T. Dobrowiecki
    Proceedings of the 40th IEEE Conference on Decision and Control, Orlando, Florida, USA, December 2001, pp. 2998-3003
  30. Measuring In-band Distortions of Mixers
    Alain Geens, Yves Rolain, Kenneth Vanhoenacker, Johan Schoukens
    IMTC/2002, Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, 21-23 May, 2002, Vol. 2, pp. 1335-1339
  31. Fully Automated Spectral Analysis of Periodic Signals
    J. Schoukens, Y. Rolain, G. Simon, R. Pintelon
    IMTC/2002, Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, 21-23 May, 2002, Vol. 1, pp. 299-302
  32. A first step in the identification of distributed parameter models
    Kathleen De Belder, Johan Schoukens, Rik Pintelon, Steve Vanlanduit
    SEM Annual Conference on Experimental and Applied Mechanics, Milwaukee, Wisconsin, June 10-12, 2002, pp. 41-46
  33. First Estimates of Wiener-Hammerstein Systems Using a Random Multisine Excitation
    Philippe Crama and Johan Schoukens
    IFAC, 15th Triennial World Congress, Barcelona, Spain, 21-26 July, 2002, pp. 402-407
  34. Some pecularities of identification in the presence of model errors
    Rik Pintelon and Johan Schoukens
    IFAC, 15th Triennial World Congress, Barcelona, Spain, 21-26 July, 2002, pp. 57-62
  35. Identification of the stability of feedback systems in the presence of nonlinear distortions
    J. Schoukens, R. Pintelon, T. Dobrowiecki
    IFAC, 15th Triennial World Congress, Barcelona, Spain, 21-26 July, 2002, pp. 418-423
  36. Excitation design for FRF measurements in the presence of nonlinear distortions.
    J. Schoukens, J. Swevers, R. Pintelon, H. Van der Auweraer
    ISMA 2002, Noise and Vibration Engineering, Leuven, 16-18 September 2002, pp. 951-958
  37. Hammerstein-Wiener System Estimator Initialization
    Philippe Crama and Johan Schoukens
    ISMA 2002, Noise and Vibration Engineering, Leuven, 16-18 September 2002, pp. 1169-1176
  38. Summary and comparing overview of techniques for the detection of non-linear
    distortions
    K. Vanhoenacker, J. Schoukens, J. Swevers and D. Vaes
    ISMA 2002, Noise and Vibration Engineering, Leuven, 16-18 September 2002, pp. 1241-1255
  39. An Automatic Harmonic Selection Scheme based on Spectrum Analyzer Measurements
    D. Rabijns, G. Vandersteen, Y. Rolain, W. Van Moer, A. Geens, J. Schoukens
    60th ARFTG conference digest, Washington D.C., December 5-6, 2002
  40. ON THE EFFICIENCY LOSS OF CUMULANT BASED IDENTIFICATION METHODS
    Johan Van Kerckhoven, Johan Schoukens
    22nd Benelux Meeting on Systems and Control, Lommel, Belgium, March 19-21, 2003
  41. Creating Spectrally Pure Signals for ADC-testing
    D. Rabijns, G. Vandersteen, W. Van Moer, Y. Rolain and J. Schoukens
    IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 614-618
  42. Linearization of nonlinear dynamic systems
    J. Schoukens, J. Nemeth, G. Vandersteen, R. Pintelon, P. Crama
    IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 1524-1527
  43. Fast approximate identification of nonlinear systems
    J. Schoukens, J. Nemeth, P. Crama, Y. Rolain, R. Pintelon
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 61-66
  44. Identification of Linear Systems with Nonlinear Distortions
    J. Schoukens, R. Pintelon, T. Dobrowiecki, Y. Rolain
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 1761-1772
  45. Uncertainty of transfer function modeling using prior estimated noise models
    Rik Pintelon, Johan Schoukens and Yves Rolain
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 1874-1879
  46. Measuring Nonlinear Differential RF Amplifiers using one Single-Ended Source
    Y. Rolain, Wendy Van Moer, Johan Schoukens and Rik Pintelon
    62nd ARFTG Conference Digest, Boulder, CO, December 4-5, 2003, pp. 17-24
  47. Variance analysis of frequency response function measurements using periodic excitations
    T. D'haene, R. Pintelon, J. Schoukens and E. Van Gheem
    23rd Benelux meeting on Systems and Control, Helvoirt, The Netherlands, March 17-19, 2004
  48. Fast Measurement of Quantization Distortions in DSP Algorithms
    J. Paduart, J. Schoukens en Y. Rolain
    23rd Benelux meeting on Systems and Control, Helvoirt, The Netherlands, March 17-19, 2004
  49. Reduction of the Gibbs Phenomenon in the Special Case of Non-Harmonic Time Base Distortions
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and Anouk Verheyden
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 318-321
  50. Modified AIC and MDL Model Selection Criteria for Short Data Records
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and David Paul Gilikin
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 1713-171
  51. Improved Approximate identification of Nonlinear Systems
    J. Schoukens, Y. Rolain and R. Pintelon
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 2183-2186
  52. Fast Measurement of Quantization Distortions in DSP Algorithms
    J. Paduart, J. Schoukens en Y. Rolain
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 140-1452
  53. Variance analysis of frequency response function measurements using periodic excitations
    T. D'haene, R. Pintelon, J. Schoukens and E. Van Gheem
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 1595-1600
  54. Optimal measurements of linear approximation to Volterra TITO systems
    T. Dobrowiecki, J. Schoukens
    BEC 2004, Proceedings of the 9th Biennial Baltic Electronics Conference, Tallinn, Estonia, October 3-6, 2004, pp. 189-195
  55. Identifying the main nonlinear contributions: Use of multitone excitations during circuit design
    L. De Locht, G. Vandersteen, P. Wambacq, Y. Rolain, R. Pintelon, J. Schoukens and S. Donnay
    64 ARFTG conference, Orlando, Florida, 3-4 December 2004, pp. 75-84
  56. Using Multisines to Mesure State-of-the-art Analog to Digital Converters
    D. Rabijns, W. Van Moer, G. Vandersteen and J. Schoukens
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 7-12
  57. Diffusion Systems: Stability, Modeling, and Identification
    R. Pintelon, J. Schoukens, L. Pauwels, and E. Van Gheem
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 894-899
  58. Leakage reduction in frequency response function measurements
    J. Schoukens, Y. Rolain, R. Pintelon
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 904-909
  59. Initial estimates for block structured nonlinear systems with feedback
    J. Schoukens, J. Swevers, J. Paduart, D. Vaes, K. Smolders, R. Pintelon
    2005 International Symposium on Nonlinear Theory and its Applications (NOLTA 2005), Bruges, Belgium, October 18-21, 2005, pp. 622-625
  60. Blind maximum likelihood identification of Wiener systems
    L. Vanbeylen, R. Pintelon, J. Schoukens
    25th Benelux Meeting on Systems and Control, March 13-15, 2006, Heeze, The Netherlands, pp. 62
  61. Multivariable Frequency Domain Box-Jenkins Identification
    Rik Pintelon, Patrick Guillaume, Johan Schoukens
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 208-213
  62. Generation and Processing of Robust Periodic Excitations
    Yves Rolain, Rik Pintelon, Johan Schoukens
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 1347-1351
  63. Nonparametric Initial Estimates for Wiener-Hammerstein Systems
    Johan Schoukens, Rik Pintelon, Johan Paduart, Gerd Vandersteen
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 778-783
  64. Initial Estimates for the Dynamics of a Hammerstein System
    Johan Schoukens, Widanalage Dhammika Widanage (Univ. of Warwick), Keith Richard Godfrey (Univ. of Warwick), Pintelon, Rik
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 774-777
  65. Reliability of Parametric Variance Estimates for Identified Transfer Functions
    Johan Schoukens, Paul M.J. Van den Hof (Delft Univ. of Tech.), Rik Pintelon
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 1033-1037
  66. Identification of Nonlinear and Linear Systems, Similarities, Differences and Challenges
    Johan Schoukens, Rik Pintelon, Yves Rolain
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 122-124
  67. Estimation of nonparametric noise models
    Johan Schoukens, Rik Pintelon
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 102-106
  68. Continuous-Time Noise Modelling from Sampled Data
    R. Pintelon, J. Schoukens, P. Guillaume
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1010-1014
  69. System Identification Approach Applied to Jitter Estimation
    F. Verbeyst, Y. Rolain, J. Schoukens, R. Pintelon
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1752-1757
  70. Comparison of Filter Design Methods to generate Analytic Signals
    L. Vanbeylen, J. Schoukens
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 883-887
  71. Understanding the Nonlinearity of a Mixer Using Multisine Excitations
    K. Vandermot, W. Van Moer, J. Schoukens, Y. Rolain
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1205-1209
  72. Non-parametric Noise Models extracted from Overlapping Sub-records
    Kurt Barbé, Johan Schoukens
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1758-1763
  73. Nonlinear system identification on a combine harvester
    Coen, T.; Paduart, J.; Anthonis, J.; Schoukens, J.; De Baerdemaeker, J.
    American Control Conference, 2006, Minneapolis, MN , 14-16 June 2006
    (6pp.)
  74. Continuous-time operational modal analysis
    R. Pintelon, P. Guillaume, and J. Schoukens
    Proceedings of ISMA2006, International Conference on Noise and Vibration Engineering, 18-20 September, 2006, pp. 3021-3034
  75. Nonlinear Structure Analysis using the Best Linear Approximation
    Lieve Lauwers, Johan Schoukens, Rik Pintelon and Martin Enqvist
    Proceedings of ISMA2006, International Conference on Noise and Vibration Engineering, 18-20 September, 2006, pp. 2751-2760
  76. Comparison of two different nonlinear state-space identification algorithms
    Johan Paduart, Johan Schoukens, Kris Smolders, Jan Swevers
    Proceedings of ISMA2006, International Conference on Noise and Vibration Engineering, 18-20 September, 2006, pp. 2777-2784
  77. Experimental stability analysis of nonlinear feedback systems
    L. Vanbeylen, J. Schoukens
    26th Benelux Meeting on Systems and Control, Center Parcs "De Vossemeren", Lommel, Belgium, March 13-15, 2007
  78. Crystal detector as calibration standard for Large Signal Analysis
    GOMME Liesbeth, SCHOUKENS JOANNES, ROLAIN YVES, VAN MOER Wendy
    26th Benelux Meeting on Systems and Control, Center Parcs "De Vossemeren", Lommel, Belgium, March 13-15, 2007, pp. 145 - 145
  79. Enhanced Time Base Jitter Compensation of Sine Waves
    Frans Verbeyst, Yves Rolain, Johan Schoukens and Rik Pintelon
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  80. Validation of a crystal detector model for the calibration of the Large Signal Network Analyzer
    Liesbeth Gomme, Johan Schoukens, Yves Rolain and Wendy Van Moer
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  81. System identification approach applied to drift estimation
    Frans Verbeyst, Rik Pintelon, Yves Rolain, Johan Schoukens and Tracy Clement
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  82. Identification of a crystal detector using a block structured nonlinear feedback model
    Johan Schoukens, Liesbeth Gomme, Wendy Van Moer and Yves Rolain
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  83. Measuring the Response of a Voltage Controlled Oscillator using the Large-Signal Network Analyser
    Yves Rolain, Wendy Van Moer, Rik Pintelon and Johan Schoukens
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  84. Some practical applications of a nonlinear block structure identification procedure
    Lieve Lauwers, Johan Schoukens, Rik Pintelon, Wendy Van Moer and Liesbeth Gomme
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  85. Application of Blind Identification to Calibration of Sensors
    Laurent Vanbeylen, Rik Pintelon and Johan Schoukens
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  86. On the consistency of the errors-in-variables estimator using data from overlapping sub-records
    Kurt Barbé and Johan Schoukens
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  87. On the Equivalence between some Block Oriented Nonlinear Models and the Nonlinear Polynomial State Space Model
    Johan Paduart, Johan Schoukens and Liesbeth Gommé
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
  88. Blind Maximum Likelihood Identification of Wiener Systems
    Laurent Vanbeylen, Rik Pintelon, Johan Schoukens
    European Control Conference 2007 Kos, Greece 2-5 July 2007
  89. Experimental investigation of the stability of nonlinear systems
    L. Vanbeylen, J. Schoukens
    27th Benelux Meeting on Systems and Control, Heeze, The Netherlands, March 18-20, 2008, p. 124
  90. Identification of Wiener-Hammerstein systems by means of Support Vector Machines for Regression
    A. Marconato, D. Petri, J. Schoukens
    27th Benelux Meeting on Systems and Control, Heeze, The Netherlands, March 18-20, 2008, p. 134
  91. Robustness issues of the equivalent linear representation of a nonlinear system
    J. Schoukens, J. Lataire, G. Vandersteen, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 332-335
  92. Initial Estimates for Wiener-Hammerstein systems using the best linear approximation
    L. Lauwers, J. Schoukens, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 928-932
  93. Non-parametric power spectrum estimation via circular overlap
    K. Barbé, J. Schoukens, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 336-341
  94. Measuring the stability of nonlinear feedback systems
    Laurent Vanbeylen, Johan Schoukens and Kurt Barbé
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 922-927
  95. Blind maximum likelihood identification of Hammerstein systems
    L. Vanbeylen, R. Pintelon, J. Schoukens
    17th IFAC World Congress, Seoul (Korea), July 7-11, 2008, pp. 2708-2713
  96. Nonlinear system identification by means of SVMs: choice of excitation signals
    Anna Marconato, Andrea Boni, Dario Petri, Johan Schoukens
    16th IMEKO TC4 Symposium, Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements, Sept. 22-24, 2008, Florence, Italy
  97. Nonlinear analysis of flutter
    Mattijs Van de Walle, Johan Schoukens, Steve Vanlanduit
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
  98. Comparison of two nonlinear optimization methods for black box identification
    A. Van Mulders, M. Volckaert, J. Swevers, M. Diehl and J. Schoukens
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
  99. Three ways to do temperature reconstruction based on Bivalveproxy information
    Maite Bauwens, Henrik Ohlsson, Veerle Beelaerts, Kurt Barbé, Johan Schoukens and Frank Dehairs
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
  100. Modeling the baseband output envelope of a Microwave detector
    Liesbeth Gommé, Yves Rolain, Johan Schoukens and Rik Pintelon
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
  101. Identification of Weakly Nonlinear Systems Based on Support Vector Machines
    Anna Marconato, Andrea Boni, Dario Petri, Johan Schoukens
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 122-127
  102. eSYSID: A proposal for a flexible electronic SYStem IDentification test bench
    G. Vandersteen, L. De Locht, J. Schoukens
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1309-1314
  103. Upper bounding the variations of the best linear approximation of a nonlinear system in a power sweep measurement
    J. Schoukens, T. Dobrowiecki, Y. Rolain, R. Pintelon
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1514-1519
  104. Nonparametric Noise Modeling in the Presence of Exogenous Inputs
    R. Pintelon, J. Schoukens, and G. Vandersteen
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1520-1524
  105. Baseband identification and RF validation of a nonlinear feedback model for a crystal detector
    Liesbeth Gommé, Yves Rolain, Johan Schoukens and Rik Pintelon
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1605-1609
  106. Modeling the baseband output envelope of a Microwave detector
    GOMME Liesbeth, ROLAIN YVES, SCHOUKENS JOANNES, PINTELON RIK
    73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, Massachustetts, USA, pp. 29 - 32
  107. Estimates of an Upper Limit of the Number of Parameters in Nonlinear Model StructuresEstimates of an Upper Limit of the Number of Parameters in Nonlinear Model Structures
    Sjoberg Jonas E. , Schoukens Johan
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 122-125
  108. Identification of Nonlinear Feedback Systems Using a Structured Polynomial Nonlinear State Space Model
    Harnack, G., L. Lauwers, R. Pintelon, J. Schoukens
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 332-337
  109. Analysis of the Nonlinear Induced Variability in Linear System Identification
    J. Schoukens, K. Barbé, L. Vanbeylen, R. Pintelon
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, 634-639
  110. Identification of Wiener-Hammerstein Benchmark Data by Means of Support Vector Machines
    Anna Marconato, Johan Schoukens
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp 816-819
  111. Identification of a Wiener-Hammerstein System Using the Polynomial Nonlinear State Space Approach
    Paduart, J., L. Lauwers, R. Pintelon, and J. Schoukens
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 1080-1085
  112. Two nonlinear optimization methods for black box identification compared
    Anne Van Mulders, Johan Schoukens, Marnix Volckaert, Moritz Diehl
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 1086-1091
  113. Modelling of Wiener-Hammerstein Systems via the Best Linear Approximation
    Lauwers, L., R. Pintelon, and J. Schoukens
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp 1098-1103
  114. Bootstrapped Total Least Squares estimator using (circular) overlap for Errors-In-Variables identification
    Vandersteen, G., K. Barbé, R. Pintelon, and J. Schoukens
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp, 1568-1573
  115. WIENER-HAMMERSTEIN BENCHMARK
    J. Schoukens, J. Suykens, L. Ljung
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France
  116. System Identification. What does it offer to electrical engineers?
    Johan Schoukens
    Workshop 8 December, 60th anniversary of the foundation of the Faculty of Electrical Engineering and Informatics of the Technical University Budapest, 2009
  117. Frequency Domain Based Feed Forward Tuning for Friction Compensation
    David Rijlaarsdam, Vincent van Geffen, Pieter W.J.M. Nuij, Johan Schoukens and Maarten Steinbuch
    ASPE 2010, Spring Topical Meeting in Cambridge, April 10 to 13, Massachusetts, USA
  118. A VNA based broadband loadpull for non-parametric 2-port Best Linear Approximation Modelling
    Y. Rolain, J. Schoukens, R. Pintelon, L. De Locht, G. Vandersteen
    75th ARFTG, Annaheim, California, May 23-28, 2010, pp. 34-38
  119. Semi-parametric identification of parallel Hammerstein systems
    Maarten Schoukens, Yves Rolain, Rik Pintelon and Johan Schoukens
    UKACC International Conference on CONTROL 2010, Coventry, UK, 7-10 September 2010, pp 937-942
  120. Fast FRF measurement of multivariable systems using periodic excitations
    Pintelon, R., G. Vandersteen, J. Schoukens, and Y. Rolain
    IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Hangzhou (China), May 10-12, 2011, pp. 460-465
  121. On the efficiency loss of the Local Polynomial method for single experiment MIMO Frequency Response Matrix extraction
    Vandersteen, G., D. Ugryumova, Y. Rolain, L. Delocht, R. Pintelon, and J. Schoukens
    IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Hangzhou (China), May 10-12, 2011, pp. 809-813
  122. Weighted LS Estimation of Spectral Contents and Periodicity of Signals Comprising Multi-Frequency Components
    M.L.D. Lumori, J. Schoukens, J. Lataire
    IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Hangzhou (China), May 10-12, 2011, pp. 686-689
  123. Experimental validati on of a new frequency-domain fl utt er speed predicti on algorithm using a simplifi ed linear aeroelastic model
    M. Van de Walle, T. De Troyer, J. .Schoukens
    IFASD 2011, 15th International Forum on Aeroelasticity and Structural Dynamics, Paris, June 26-29, 201, 9pp.
  124. Frequency Domain Based Friction Compensation -Industrial Application to Transmission Electron Microscopes-
    David Rijlaarsdam, Pieter Nuij, Johan Schoukens and Maarten Steinbuch
    2011 American Control Conference on O'Farrell Street, San Francisco, CA, USA, June 29-July 01, 2011, pp. 4093-4098
  125. Detecting and analyzing non-linear effects in respiratory impedance measurements
    Clara Ionescu, Johan Schoukens and Robin De Keyser
    2011 American Control Conference on O'Farrell Street, San Francisco, CA, USA, June 29-July 01, 2011, pp. 5412-5417
  126. A state-space view on locally-stable, globally-unstable nonlinear models driven by Gaussian burst inputs
    Laurent Vanbeylen, Anne Van Mulders and Johan Schoukens
    50th IEEE Conference on Decision and Control and European Control Conference (CDC-ECC11), Orlando, FL, USA, December 12-15, 2011, pp. 6060-6065


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Technical notes (download)

  1. FAST APPROXIMATE IDENTIFICATION OF NONLINEAR SYSTEMS
    J. Schoukens, J. Nemeth, P. Crama, Y. Rolain, R. Pintelon
    Internal note
  2. Some pecularities of identification in the presence of model errors
    Rik Pintelon and Johan Schoukens
    Internal report
  3. Uncertainty of transfer function modeling using prior estimated noise models
    R. Pintelon, J. Schoukens and Y. Rolain
    Internal report
  4. Identification of Young's Modulus from Broadband Modal Analysis Experiments
    R. Pintelon, P. Guillaume, S. Vanlanduit, K. De Belder and Y. Rolain
    Internal report
  5. Initial estimates for the dynamics of a Hammerstein system
    J. Schoukens, W.D. Widanage, K.R. Godfrey, R. Pintelon
    Internal note ELEC June 2005
  6. Nonparametric initial estimates for Wiener-Hammerstein systems
    J. Schoukens, R. Pintelon, J. Paduart, G. Vandersteen
    Internal note ELEC June 2005
  7. Nonlinear induced variability in linear system identification
    J. Schoukens, K. Barbé, L. Vanbeylen, R. Pintelon
    Internal note ELEC September 2008

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