Publications of Rik Pintelon

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• System Identification: A Frequency Domain Approach
  Rik Pintelon and Johan Schoukens
  IEEE Press, Piscataway, NJ, 2001 (ISBN 0-7803-6000-1)
  

UP

1. A maximum likelihood estimator for linear and nonlinear systems-apractical application of estimation techniques in measurement problems
   Schoukens, J.   Pintelon, R.   Renneboog, J
   IEEE Transactions on Instrumentation and Measurement, Vol. 37, No. 1, March, 1988, pp. 10–17
2. The Geometric Mean of Power (amplitude) Spectra has a Much Smaller Bias than the Classical Arithmetic (RMS) Averaging
   Pintelon R., Schoukens J., Renneboog J.
   IEEE Transactions on Instrumentation and Measurement, June, 1988, Vol. 37, pp. 213–218
3. Survey of Excitation Signals for F.F.T. Based Signal Analyzers
   Schoukens J., Pintelon R., Van der Ouderaa E., Renneboog J.
   IEEE Transactions on Instrumentation and Measurement, September, 1988, Vol. 37, No. 3, pp. 342–351
4. Sensitivity of Roots to Errors in the Coefficients of Polynomials obtained by Frequency Domain Estimation Methods
   Guillaume P., Schoukens J., Pintelon R.
   IEEE Transactions on Instrumentation and Measurement, December, 1989,Vol. IM-38, No. 6, pp. 1050–1056
5. Towards an Ideal Data Acquisition Channel
   Pintelon R., Rolain Y., Vanden Bossche M., Schoukens J.
   IEEE Transactions on Instrumentation and Measurement, February, 1990, Vol. IM-39, No. 1, pp. 116–120
6. Phase Correction of Linear Time Invariant Systems with Digital All-Pass Filters
   Pintelon R.
   IEEE Transactions on Instrumentation and Measurement, Vol. IM-39, No 2, April, 1990, pp. 324–330
7. Identification of Transfer Functions with Time Delay and its Application to Cable Fault Location
   Pintelon R., Van Biesen L.
   IEEE Transactions on Instrumentation and Measurement, Vol. IM–39, No. 3, June, 1990, pp. 479–484
8. Robust Identification of Transfer Functions in the s- and z-Domains
   Pintelon R., Schoukens J.
   IEEE Transactions on Instrumentation and Measurement, Vol. 39, No. 4, August, 1990, pp. 565–573
9. On the use of Signals with a Constant Signal-to-Noise Ratio in the Frequency-Domain
   Guillaume P., Pintelon R., Schoukens J.
   IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 835–842
10. Amplitide-Only versus Amplitude-Phase Estimation
    Rolain Y., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 818–823
11. Optimal FIR and IIR Hilbert Transformer Design Via LS and Minimax Fitting
    Kollár I., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 847–852
12. Measurement of Frequency Response Functions in Noisy Environments
    Schoukens J., Pintelon R.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 905–909
13. Real-Time Integration and Differentiation of Analog Signals by Means of Digital Filtering
    Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, December, 1990, Vol. IM-39, No. 6, pp. 923–927
14. Comments on "Design of IIR Filters in the Complex Domain"
    Pintelon R.
    IEEE Transactions on Signal Processing, Vol. SP-39, No. 6, June, 1991, pp. 1454–1455
15. Correspondence : Another Step Towards an Ideal Data Acquisition Channel
    Kollár I., Pintelon R., Rolain Y., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-40, No. 3, June, 1991, pp. 659–660
16. Crest-Factor Minimization Using Nonlinear Chebyshev Approximation Methods
    Guillaume P., Schoukens J., Pintelon R., Kollár I.
    IEEE Transactions on Instrumentation and Measurement, Vol. 40, No. 6, December, 1991, pp. 982–989
17. Parametric Identification of Two-Port Models in the Frequency Domain
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, IM-41, No. 2, April, 1992, pp. 233–239
18. The Interpolated Fast Fourier Transform : A Comparative Study
    Schoukens J., Pintelon R., Van hamme H.
    IEEE Transactions on Instrumentation and Measurement, IM-41, No. 2, April, 1992, pp. 226–232
19. Non-parametric Frequency Response Functions Estimators Based on Nonlinear Averaging Techniques
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-41, No. 6, December, 1992, pp. 739-746
20. Identification of linear Systems Captured in a Feedback Loop
    Pintelon R., Guillaume P., Rolain Y., Verbeyst F.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-41, No. 6, December, 1992, pp. 747-754
21. Identification of Parametric Models for Ultrasonic Wave Propagation in the presence of Absorption and Dispersion
    Peirlinckx L., Pintelon R., Van Biesen L.
    IEEE Transactions on Ultrasonic., Ferro. and Freq. Contr., July, 1993, Vol. 40, No. 4, pp. 302–312
22. Identification of Synchronous Machines Parameters Using Broadband excitation
    Beya K., Pintelon R., Schoukens J., Lataire P., Guillaume P., Mpanda-Mabwe B., Delhaye M.
    IEEE Transactions on Energy Conversion, Vol. 9, No. 2, June 1994, pp. 270–280
23. Design of a Microwave Multisine Source Using Allpass Functions Estimated in the Richards Domain
    Van den Broeck T., Pintelon R., Alain B.
    IEEE Transactions on Instrumentation and Measurement, Vol. 43, No. 5, October 1994, pp. 753–757
24. Quantifying Model Errors of Identified Transfer Functions
    Schoukens J., Pintelon R.
    IEEE Transactions on Automatic Control, Vol. 39, No. 8, August 1994, pp. 1733–1737
25. Parametric Identification of Transfer Functions in the Frequency Domain—A Survey
    Pintelon R., Guillaume P., Rolain Y., Schoukens J., Van Hamme H.
    IEEE Transactions on Automatic Control, Vol. 39, No. 11, November 1994, pp. 2245–2260
26. Robust parametric transfer function estimation using complex logarithmic frequency response data
    Guillaume P., Pintelon R., Schoukens J.
    IEEE Transactions on Automatic Control, Vol. 40, No. 7, July 1995, pp. 1180–1190
27. Best Conditioned Parametric Identification of Transfer Function Models in the Frequency Domain
    Rolain Y., Pintelon R., Xu K.Q. and Vold H.
    IEEE Transactions on Automatic Control, Vol. 40, No. 11, November 1995, pp. 1954–1960
28. Measurement of Noise (Cross-)Power Spectra for Frequency-Domain System Identification Purposes: Large-Sample Results
    Pintelon R., Guillaume P. and Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-44, no 1, February 1996, pp. 12–21
29. An Improved Sine-wave Fitting Procedure for Characterizing Data Acquisition Channels
    Pintelon R. and Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-45, No. 2, April 1996, pp. 588–593
30. Statistical Analysis of Nonparametric Transfer Function Estimates
    Guillaume P., Kollar I. and Pintelon R.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-45, No. 2, April 1996, pp. 594–600
    
31. On the Use of System Identification for Accurate Parametric Modelling of Non-Linear Systems using Noisy Measurements
    Vandersteen G., Rolain Y., Schoukens J. and Pintelon R.
    IEEE Transactions on Instrumentation and Measurement, Vol. IM-45, No. 2, April 1996, pp. 605-609
32. Minimum Variance Bounds for Overparametrized Models
    Pintelon R., Schoukens J. and Rolain Y.
    IEEE Transactions on Automatic Control, 1996, Vol. AC-41, No. 5, May 1996, pp. 719–720
33. A Gauss–Newton-Like Optimization Algorithm for "Weighted" Nonlinear Least-Squares Problems
    Guillaume P. and Pintelon R.
    IEEE Transactions on Signal Processing, Vol. 44, No. 9, September 1996, pp. 2222–2228
34. Design of Stable IIR Filters in the Complex domain by Automatic Delay Selection
    Vuerinckx R., Rolain Y., Schoukens J., Pintelon R.
    IEEE Transactions on Signal Processing, Vol. 44, No. 9, September 1996, pp. 2339–2344
    
35. General Framework for Asymptotic Properties of Generalized Weighted Nonlinear Least-Squares Estimators with Deterministic and Stochastic Weighting
    Vandersteen G., Van hamme H. and Pintelon R.
    IEEE Transactions on Automatic Control, Vol. 41, No. 10, October 1996, pp. 1501-1507
36. Frequency–Domain Identification of Linear Time–Invariant Systems Under Nonstandard Conditions
    Pintelon R. and Schoukens J.
    IEEE Transactions on Instrumentation and Measurement, Vol. 46, No. 1, February 1997, pp. 65–71
37. Model Selection through a Statistical Analysis of the Global Minimum of a Weighted Nonlinear Least Squares Cost Function
    Pintelon R., Schoukens J. and Vandersteen G.
    IEEE Transactions on Signal Processing, Vol. 45, No. 3, March 1997, pp. 686-693
38. A Sinewave Fitting Procedure for Characterizing Data Acquisition Channels in the presence of Time Base Distortions and Time Jitter
    Schoukens J., R. Pintelon and G. Vandersteen
    IEEE Transactions on Instrumentation and Measurement, Vol. 46, No. 4, August 1997, pp. 1005–1010
39. Order Estimation for Linear Time-Invariant Systems using Frequency Domain Identification Methods
    Y. Rolain, J. Schoukens and R. Pintelon.
    IEEE Transactions on Automatic Control, Vol. 42, No. 10, October 1997, pp. 1408–1417
40. Frequency Domain System Identification Using Arbitrary Signals
    R. Pintelon, J. Schoukens and G. Vandersteen
    IEEE Transactions on Automatic Control, Vol. 42, No. 12, December 1997, pp. 1717–1720
41. Improved Frequency Response Function Measurements for Random Noise Excitations
    Johan Schoukens, Yves Rolain and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 47, No. 1, February 1998, pp. 322–326
42. Parametric and Nonparametric Identification of Linear Systems in the Presence of Nonlinear Distortions—A frequency Domain Approach
    Johan Schoukens, Tadeusz Dobrowiecki and Rik Pintelon
    IEEE Transactions on Automatic Control, Vol. 43, No. 2, February 1998, pp. 176–190
43. Induction Motor Dynamic and Static Inductance Identification Using a Broadband Excitation Technique
    A. Ganji, P. Guillaume, R. Pintelon and P. Lataire
    IEEE Transactions on Energy Conversion, Vol. 13, No. 1, March 1998, pp. 15–20
44. Identification of Linear Time Invariant Diffusion Phenomenae
    R. Pintelon
    IEEE Transactions on Instrumentation and Measurement, , Vol. IM-47, no 5, October 1998, pp. 1053–1055
45. Time series Analysis in the Frequency Domain
    Rik Pintelon and Johan Schoukens
    IEEE Transactions on Signal Processing, Vol. 47, No. 1, January 1999, pp. 206–210
46. Frequency-Domain Identification of Linear Systems Using Arbitrary Excitations and a Nonparametric Noise Model
    J. Schoukens, G. Vandersteen, R. Pintelon and P. Guillaume
    IEEE Transactions on Automatic Control, Vol. 44, No. 2, February 1999, pp. 343–347
47. Identification of Invariants of (Over)Parameterized Models: Finite Sample Results
    R. Pintelon, J. Schoukens, G. Vandersteen and Y. Rolain
    IEEE Transactions on Automatic Control, Vol. 44, No. 5, May 1999, pp. 1073–1077
48. Identification of Continuous-Time Systems with Missing Data
    R. Pintelon and J. Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 48, No. 3, June 1999, pp. 736–740
49. Determination of Synchronous Machine Parameters Using Network Synthesis Techniques.
    J. Verbeeck, R. Pintelon and P. Guillaume
    IEEE Transactions on Energy Conversion, Vol. 14, No. 3, September 1999, pp. 310–314
50. Identification of Synchronous Machine Parameters Using a Multiple Input Multiple Output Approach
    J. Verbeeck, R. Pintelon and P. Lataire
    IEEE Transactions on Energy Conversion, Vol. 14, No. 4, December 1999, pp. 909–917
51. Relationships between Parameter Sets of Equivalent Synchronous Machine Models
    J. Verbeeck, R. Pintelon and P. Lataire
    IEEE Transactions on Energy Conversion, Vol. 14, No. 4, December 1999, pp. 1075–1080
52. Frequency Domain System Identification with Missing Data
    R. Pintelon and J. Schoukens
    IEEE Transactions on Automatic Control, Vol. 45, No. 2, February 2000, pp. 364–369
53. Learning Neural Networks with Noisy Inputs Using the Errors-in-Variables Approach
    Jürgen Van Gorp, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Neural Networks, Vol. 11, No. 2, March 2000, pp. 402–414
54. Broadband versus Stepped Sine FRF Measurements
    J. Schoukens, R. Pintelon and Y. Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 49, No. 2, April 2000, pp. 275–278
55. Influence of Saturation on Estimated Synchronous Machine Parameters in Standstill Frequency Response Tests
    Jef Verbeeck, Rik Pintelon and Philippe Lataire
    IEEE Transactions on Energy Conversion, Vol. 15, No. 3, September 2000, pp. 277–283
56. Maximum Likelihood Estimator for Jitter Noise Models
    Gerd Vandersteen and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 49, No. 6, December 2000, pp. 1282–1284
57. Obtaining Accurate Confidence Regions for the Estimated Zeros and Poles in System Identification Problems
    R. Vuerinckx, R. Pintelon, J. Schoukens and Y. Rolain
    IEEE Transactions on Automatic Control, Vol. 46, No. 4, pp. 656-659, April 2001
58. Identification of Linear Systems in the Presence of Nonlinear Distortions
    R. Pintelon, J. Schoukens, W. Van Moer and Y. Rolain
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 4, August 2001, pp. 855-863
59. Modeling in the Presence Of Switching Uncertainties
    Wendy Van Moer, Yves Rolain and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 50, No. 5, October 2001, pp. 1103–1108
60. Measurement and Modelling of Linear Systems in the Presence of Non-Linear Distortions
    R. Pintelon and J. Schoukens
    Mechanical Systems and Signal Processing (2002) 16(5), pp. 785-801
61. Measurement of Multivariable Frequency Response Functions in the Presence of Non-Linear Distortions – Some Practical Aspects
    N. Dedene, R. Pintelon and P. Lataire
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 4, August 2002, pp. 577-582
62. Linear Modeling in the Presence of Nonlinear Distortions
    Johan Schoukens, Rik Pintelon and Tadeusz Dobrowiecki
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 4, August 2002, pp. 786-792
63. An Efficient Nonlinear Least Square Multisine Fitting Algorithm
    Guyla Simon, Rik Pintelon, László Sujbert and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 51, No. 4, August 2002, pp. 750-755
64. Probability Density Function for Frequency Response Function Measurements Using Periodic Signals
    R. Pintelon, Y. Rolain and W. Van Moer
    IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 1, February 2003, pp. 61-68
65. Estimation of a Global Synchronous Machine Model Using a Multiple-Input Multiple-Output Estimator
    Nele Dedene, Rik Pintelon and Philippe Lataire
    IEEE Transactions on Energy Conversion, Vol. 18, No. 1, February 2003, pp. 11-16
66. Fully Automated Spectral Analysis of Periodic Signals
    J. Schoukens, Y. Rolain, G. Simon, R. Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 52, No. 4, August 2003, pp. 1021-1024
67. Experimental Characterization of Operational Amplifiers: a System Identification Approach—Part I: Theory and Simulations
    R. Pintelon, G. Vandersteen, Ludwig De Locht, Y. Rolain and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 3, June 2004, pp. 854-862
68. Experimental Characterization of Operational Amplifiers: a System Identification Approach—Part II: Calibration and Measurements
    R. Pintelon, Y. Rolain, G. Vandersteen and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 3, June 2004, pp. 863-876
69. Linearization of nonlinear dynamic systems
    J. Schoukens, J. Nemeth, G. Vandersteen, R. Pintelon, P. Crama
    IEEE Transactions on Instrumentation and Measurement, Vol. 53, No. 4, August 2004, pp. 1245-1248
70. Decoding non-linear growth rates in biogenic environmental archives
    Fjo De Ridder, Rik Pintelon, Johan Schoukens, David Paul Gillikin, Luc André, Willy Baeyens, Anouk de Brauwere and Frank Dehairs
    Geochemistry, Geophysics, Geosystems (G3), An Electronic Journal of the Earth Sciences, Published by AGU and the Geochemical Society, Volume 5, Number 12, 30 December, 2004
71. Box-Jenkins alike identification using nonparametric noise models
    J. Schoukens, R. Pintelon, Y. Rolain
    Automatica 40 (2004), pp. 2083-2089
    
72. Modified AIC and MDL Model Selection Criteria for Short Data Records
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and David Paul Gillikin
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 1, February 2005, pp. 144-150
73. On the Frequency Scaling in Continuous-Time Modeling
    R. Pintelon and I. Kollár
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 1, February 2005, pp. 318-321
74. Reduction of the Gibbs Phenomenon Applied on Nonharmonic Time Base Distortions
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and Anouk Verheyden
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 3, June 2005, pp. 1118-1125
75. Variance analysis of frequency response function measurements using periodic excitations
    T. D’haene, R. Pintelon, J. Schoukens and E. Van Gheem
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 4, August 2005, pp. 1452-1456
76. Diffusion systems: stability, modeling and identification
    Pintelon R., J. Schoukens, L. Pauwels, and E. Van Gheem
    IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 5, October 2005, pp. 2061-2067
77. Application of Structured Total Least Squares for System Identification
    Ivan Markovsky, Jan C. Willems, Sabine Van Huffel, Bart De Moor and Rik Pintelon
    IEEE transactions on Automatic Control, Vol. 50, No. 10, October 2005, pp. 1490-1500
78. Numerically robust frequency domain identification of multivariable systems
    A. Bultheel, M. Van Barel, Y. Rolain and R. Pintelon
    IEEE Transactions on Automatic Control, Vol. 50, No. 11, November 2005, pp. 1835-1839
79. Estimating Parameterized Scalable Models From the Best Linear Approximation of Nonlinear Systems for Accurate High-Level Simulations
    Ludwig De Locht, Gerd Vandersteen, Yves Rolain and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 4, August 2006, pp. 1186-1191
80. An Iterative Method to Stabilize a Transfer Function in the s- and z-Domains
    Tom D'haene, Rik Pintelon and Gerd Vandersteen
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 4, August 2006, pp. 1192-1196
81. Experimental Characterization of the Nonlinear Behavior of RF Amplifiers
    Yves Rolain, Wendy Van Moer, Rik Pintelon and Johan Schoukens
    IEEE Transactions on Microwave Theory and Techniques, Vol. 54, No. 8, August 2006, pp. 3209-3218
82. On Parameter Estimation Using Nonparametric Noise Models
    Kaushik Mahata, Rik Pintelon and Johan Schoukens
    IEEE Transactions on Automatic Control, Vol. 51, No. 10, October 2006, pp. 1602-1612
83. Continuous-Time Noise Modeling From Sampled Data
    Rik Pintelon, Johan Schoukens and Patrick Guillaume
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 6, December 2006, pp. 2253-2258
84. Leakage reduction in frequency response function measurements
    J. Schoukens, Y. Rolain, R. Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 55, No. 6, December 2006, pp. 2286-2291
85. Measuring Nonlinear Differential RF Amplifiers using one Single-Ended Source
    Yves Rolain, Wendy Van Moer, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 3, June 2007, pp. 1042-1048
86. Asymptotic Uncertainty of Transfer Function Estimates Using Non-Parametric Noise Models
    R. Pintelon, and M. Hong
    IEEE Transactions on Instrumentation and Measurement, Vol. 56, No. 6, December 2007, pp. 2599-2605
87. Consistent Impulse-Response Estimation and System Realization From Noisy Data
    Edwin Reynders, Rik Pintelon and Guido De Roeck
    IEEE Transactions on Signal Processing, Vol. 56, No. 7, July 2008, pp. 2696-2705
88. Frequency-Domain, Errors-in-Variables Estimation of Linear Dynamic Systems Using Data From Overlapping Subrecords
    Kurt Barbé, Johan Schoukens and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 8, August 2008, pp. 1529-1536
89. Application of Blind Identification to Nonlinear Calibration
    Laurent Vanbeylen, Rik Pintelon and Johan Schoukens
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 8, August 2008, pp. 1771-1778
90. A Nonlinear Block Structure Identification Procedure Using Frequency Response Function Measurements
    Lieve Lauwers, Johan Schoukens, Rik Pintelon and Martin Enqvist
    IEEE Transactions on Instrumentation and Measurement, Vol. 57, No. 10, October 2008, pp. 2257-2264
91. Passivity Enforcement of Transfer Functions
    T. D'haene, R. Pintelon
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, VOL. 57, NO. 10, OCTOBER 2008, pp. 2181-2187
92. Blind maximum likelihood identification of Hammerstein systems
    L. Vanbeylen, R. Pintelon, J. Schoukens
    Automatica 44 (2008), pp. 3139-3146
93. Quasi-Analytical Bit-Error-Rate Analysis Technique Using Best Linear Approximation Modeling
    Gerd Vandersteen, Yves Rolain, Koen Vandermot, Rik Pintelon, Johan Schoukens and Wendy Van Moer
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 2, February 2009, pp. 475-482
94. Measurement of non-linear distortions in the vibration of acoustic transducers and acoustically driven membranes
    J.R.M. Aerts, J.J.J. Dirckx, R. Pintelon
    Optics and Lasers in Engineering 47(2009) 419–430
95. Estimating a Nonparametric Colored-Noise Model for Linear Slowly Time-Varying Systems
    John Lataire, Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 5, May 2009, pp. 1535-1545
96. Robustness Issues of the Best Linear Approximation of a Nonlinear System
    Johan Schoukens, John Lataire, Rik Pintelon, Gerd Vandersteen, and Tadeusz Dobrowiecki
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 5, May 2009, pp. 1737-1745
97. Estimation of Nonparametric Noise Models for Linear Dynamic Systems
    Johan Schoukens and Rik Pintelon
    IEEE Transactions on Instrumentation and Measurement, Vol. 58, No. 8, AUGUST 2009, pp. 2468-2474
98. Blind maximum-likelihood identification of Wiener Systems
    Vanbeylen, L., R. Pintelon and J. Schoukens
    IEEE Transactions on Signal Processing, Vol. 57, No. 8, August 2009, pp. 3017-3029
99. Time domain model validation of a nonlinear block-oriented structure
    GOMME Liesbeth, ROLAIN YVES, SCHOUKENS JOANNES, PINTELON RIK
    MEASUREMENT SCIENCE AND TECHNOLOGY, 2009 105106, vol. 20, n. 10, published by IOP Publishing Ltd
    (URL: http://www.iop.org/EJ/abstract/0957-0233/20/10/105106/)
100. Odd random phase multisine EIS as a detection method for the onset of corrosion of coated steel
     Tom Breugelmans , Els Tourwé, Yves Van Ingelgem, Jan Wielant,Tom Hauffman, René Hausbrand, Rik Pintelon, Annick Hubin
     Electrochemistry Communications 12 (2010) 2–5
101. Continuous-time operational modal analysis in the presence of harmonic disturbances—The multivariate case
     R. Pintelon, B. Peeters, P. Guillaume
     Mechanical Systems and Signal Processing Vol. 24, No. 1 (2010) 90–105
102. Estimation of nonparametric noise and FRF models for multivariable systems—Part I: Theory
     R. Pintelon, J. Schoukens, G. Vandersteen, K. Barbé
     Mechanical Systems and Signal Processing 24 (2010) 573–595
103. Estimation of nonparametric noise and FRF models for multivariable systems—Part II: Extensions, applications
     R. Pintelon, J. Schoukens, G. Vandersteen, K. Barbé
     Mechanical Systems and Signal Processing 24 (2010) 596–616
     
104. Upper Bounding Variations of Best Linear Approximations of Nonlinear Systems in Power Sweep Measurements
     J. Schoukens, T. Dobrowiecki, Y. Rolain, R. Pintelon
     IEEE Transactions on Instrumentation and Measurement, May 2010, Vol. 59, No. 5, pp. 1141-1148
105. Analyzing Rice distributed functional magnetic resonance imaging data: a Baysian approach
     Lauwers, L., K. Barbé, W. Van Moer, and R. Pintelon
     Measurement Science & Technology, vol. 21, no. 11, 12 pp. (2010)
106. Modelling of the porous anodizing of aluminium: Generation of experimental input data and optimization of the considered mode
     Tim Aerts, Els Tourwé, Rik Pintelon, Iris De Graeve, Herman Terryn
     Surface & Coatings Technology Vol. 205, No. 19, (2011), pp. 4388-4396
107. Frequency-domain weighted non-linear least-squares estimation of continuous-time, time-varying systems
     J. Lataire, R. Pintelon
     IET Control Theory and Applications, 2011, Vol. 5, No. 7, pp. 923–933
108. Improved (non-)parametric identification of dynamic systems excited by periodic signals—The multivariate case
     R. Pintelon, G. Vandersteen, J. Schoukens, Y. Rolain
     Mechanical Systems and Signal Processing, Vol. 25, No. 8 (2011) pp. 2892–2922
     
109. The Use of Nonparametric Noise Models Extracted From Overlapping Subrecords for System Identification
     Kurt Barbé, Johan Schoukens and Rik Pintelon
     IEEE Transactions on Signal Processing, Vol. 59, No. 10, October 2011, pp. 4635-4647
110. Parametric Identification of Parallel Hammerstein Systems
     Maarten Schoukens, Rik Pintelon, Yves Rolain
     IEEE Transactions on Instrumentation and Measurement, December 2011, Vol. 60, No. 12, pp. 3931-3938
111. Identification of a Wiener–Hammerstein system using the polynomial nonlinear state space approach
     J. Paduart, L. Lauwers, R. Pintelon, J. Schoukens
     Control Engineering Practice, Volume 20, Issue 11, November 2012, Pages 1133-1139
     
     

UP

1. Minimum variance bounds for overparametrized models
   R. Pintelon, Schoukens J. and Rolain Y.
   Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15, 1995, pp. 1815-1816
   
2. Order estimation for linear time-invariant systems using frequency domain identification methods
   Rolain Y., Schoukens J., and Pintelon R.
   Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15 1995, pp. 3588-3593
3. Identification of linear systems in the presence of nonlinear distortions A frequency domain approach Part I: Non-parametric identification
   Schoukens J., Dobrowiecki T. and R. Pintelon
   Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15, 1995, pp. 1216-1221
   
4. Identification of linear systems in the presence of nonlinear distortions A frequency domain approach Part II: Parametric identification
   Schoukens J., Dobrowiecki T. and R. Pintelon
   Proceedings of the 34th IEEE conference on Decision and Control, New Orleans, LA, December 13-15, 1995, pp. 1222-1227
   
5. Model Selection Through a Statistical Analysis of the Global Minimum of a Weighted Non-Linear Least Squares Cost Function
   R. Pintelon, J. Schoukens and G. Vandersteen
   Proceedings of the 35th Conference on Decision and Control, Kobe, Japan, December 11-13, 1996, pp. 3100-3106
   
6. Frequency Domain System Identfication Using Arbitrary Signals
   R. Pintelon, J. Schoukens and G. Vandersteen
   Proceedings of the 35th Conference on Decision and Control, Kobe, Japan, December 11-13, 1996, pp. 2048-2051
7. Study of conditional MLE in time and frequency domain system identification
   J. Schoukens, R. Pintelon and Y. Rolain
   European Control Conference, ECC 97, Brussels, Belgium, July 1-4, 1997, Vol. 5, TH-E F6
8. General Framework for Asymptotic Properties of Generalized Weighted Nonlinear Least-Squares Estimators with Deterministic and Stochastic Weighting
   Vandersteen G., Van hamme H. and Pintelon R.
   European Control Conference, ECC 97, Brussels, Belgium, July 1-4, 1997, Vol. 6 Part B, FR-A F3
9. GTLS Algorithms in the Frequency Domain System Identification using Noise Information out of A Finite Number of Repeated Independent Realizations
   Gerd Vandersteen, Rik Pintelon and Johan Schoukens
   European Control Conference, ECC 97, Brussels, Belgium, July 1-4, 1997, Vol. 4, TH-M-F5
10. Adding Input Noise to Increase the Generalization of Neural Networks is a Bad Idea
    Van Gorp Jürgen, Schoukens Johan, Pintelon Rik
    ANNIE 1998, Intelligent Engineering Systems Through Artificial Neural Networks, Volume 8, pp. 127 - 132
11. The Errors-In-Variables Cost Function for Learning Neural Networks with Noisy Inputs
    Van Gorp Jürgen, Schoukens Johan, Pintelon Rik
    ANNIE 1998, Intelligent Engineering Systems Through Artificial Neural Networks, Volume 8, pp. 141 - 146
    
12. Frequency Domain System Identification with Missing Data
    R. Pintelon and J. Schoukens
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 701-705
13. Fast Calculation of Least-Squares Estimates for System Identification
    J. Schoukens, Y. Rolain, F. Gustafsson and R. Pintelon
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 3408-3410
    
14. Frequency Domain Identification of Linear Systems Using Arbitrary Excitations and a Nonparametric Noise Model
    J. Schoukens, G. Vandersteen, R. Pintelon and P. Guillaume
    Proceedings of the 37th IEEE Conference on Decision and Control, Tampa, Florida, USA, December 16-18, 1998, pp. 3909-3913
15. Maximum Likelihood Estimator for Jitter Noise Models
    Gerd Vandersteen and Rik Pintelon
    IMTC/99, Proceedings of the 16th IEEE Instrumentation and Measurement Technology Conference, Venice, Italy, May 24-26, 1999, Vol. 2, pp. 877-879
16. Modeling in the Presence Of Switching Uncertainties
    Wendy Van Moer, Yves Rolain and Rik Pintelon
    IMTC/2000, Proceedings of the 17th IEEE Instrumentation and Measurement Technology Conference, Baltimore, Maryland, USA, May 1-4, 2000, pp. 1260-1265
    
17. Measurement and Modeling of Linear Systems in the Presence of Non-linear Distortions
    R. Pintelon and J. Schoukens
    Proceedings ISMA 25, Leuven, September 13-15, 2000, Noise and Vibration Engineering, Vol. 1, pp. 451-458
18. Frequency response function measurements in the presence of non-linear distortions. A general framework and practical advices
    J. Schoukens, R. Pintelon, Y. Rolain and T. Dobrowiecki
    Proceedings ISMA 25, Leuven, September 13-15, 2000, Noise and Vibration Engineering, Vol. 1, pp. 459-464
    
19. Measurement of Frequency Response Functions in the Presence of Correlated Input/Output Errors
    R. Pintelon, J. Schoukens
    IMTC/2001, Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Rediscovering Measurement in the Age of Informatics, Budapest, Hungary, May 21-23, 2001, Vol. 1, pp. 2-7
20. Linear Modelling in the Presence of Nonlinear Distortions
    J. Schoukens, R. Pintelon and T. Dobrowiecki
    IMTC/2001, Proceedings of the 18th IEEE Instrumentation and Measurement Technology Conference, Rediscovering Measurement in the Age of Informatics, Budapest, Hungary, May 21-23, 2001, Vol. 2, pp. 1332-1338
    
21. Frequency Domain Subspace System Identification Using Non-Parametric Noise Models
    R. Pintelon
    Proceedings of the 40th IEEE Conference on Decision and Control, Orlando, Florida, USA, December 2001, pp. 3916-3921
22. Nonparametric model error bounds for control design in the presence of nonlinear distortions
    J. Schoukens, R. Pintelon and T. Dobrowiecki
    Proceedings of the 40th IEEE Conference on Decision and Control, Orlando, Florida, USA, December 2001, pp. 2998-3003
    
23. Probability Density Function for Frequency Response Function Measurements Using Periodic Signals
    Rik Pintelon, Y. Rolain and W. Van Moer
    IMTC/2002, Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, 21-23 May, 2002, Vol. 1, pp. 869-874
24. Fully Automated Spectral Analysis of Periodic Signals
    J. Schoukens, Y. Rolain, G. Simon, R. Pintelon
    IMTC/2002, Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, 21-23 May, 2002, Vol. 1, pp. 299-302
    
25. Identification of Transmission Lines: From Time-Domain Measurements to Frequency Domain Models
    Wim De Block, Rik Pintelon and Yves Rolain
    IMTC/2002, Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference, Anchorage, AK, USA, 21-23 May, 2002, Vol. 2, pp. 1327-1331
26. A first step in the identification of distributed parameter models
    Kathleen De Belder, Johan Schoukens, Rik Pintelon, Steve Vanlanduit
    SEM Annual Conference on Experimental and Applied Mechanics, Milwaukee, Wisconsin, June 10-12, 2002, pp. 41-46
27. Some pecularities of identification in the presence of model errors
    Rik Pintelon and Johan Schoukens
    IFAC, 15th Triennial World Congress, Barcelona, Spain, 21-26 July, 2002, pp. 57-62
28. Identification of the stability of feedback systems in the presence of nonlinear distortions
    J. Schoukens, R. Pintelon, T. Dobrowiecki
    IFAC, 15th Triennial World Congress, Barcelona, Spain, 21-26 July, 2002, pp. 418-423
    
29. Numerically robust frequency domain identification of multivariable systems
    Rik Pintelon, Y. Rolain, A. Bultheel and M. Van Barel
    ISMA 2002, Noise and Vibration Engineering, Leuven, 16-18 September 2002, pp. 1315-1322
30. Excitation design for FRF measurements in the presence of nonlinear distortions.
    J. Schoukens, J. Swevers, R. Pintelon, H. Van der Auweraer
    ISMA 2002, Noise and Vibration Engineering, Leuven, 16-18 September 2002, pp. 951-958
    
31. Experimental Characterization of Operational Amplifiers: a System Identification Approach
    Rik Pintelon, G. Vandersteen and Y. Rolain
    IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 362-367
32. Linearization of nonlinear dynamic systems
    J. Schoukens, J. Nemeth, G. Vandersteen, R. Pintelon, P. Crama
    IMTC/2003, Proceedings of the 20th IEEE Instrumentation and Measurement Technology Conference, Vail, Colorado, USA, 20-22 May, 2003, pp. 1524-1527
    
33. Identification of Material Damping from Broadband Modal Analysis Experiments
    Rik Pintelon, K. De Belder, P. Guillaume, S. Vanlanduit, Y. Rolain
    SEM Annual Conference and Exposition on Experimental and Applied Mechanics, Charlotte, North Carolina, USA, 2-4 June 2003, pp. 231-238
    
34. Measurement of Young’s Modulus via Modal Analysis Experiments: A System Identification Approach
    R. Pintelon, P. Guillaume, K. De Belder and Y. Rolain
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 389-394
35. Fast approximate identification of nonlinear systems
    J. Schoukens, J. Nemeth, P. Crama, Y. Rolain, R. Pintelon
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 61-66
    
36. Identification of Linear Systems with Nonlinear Distortions
    J. Schoukens, R. Pintelon, T. Dobrowiecki, Y. Rolain
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 1761-1772
    
37. Uncertainty of transfer function modeling using prior estimated noise models
    Rik Pintelon, Johan Schoukens and Yves Rolain
    13th IFAC Symposium on System Identification, Rotterdam, The Netherlands, 27-29 August, 2003, pp. 1874-1879
    
38. Measuring Nonlinear Differential RF Amplifiers using one Single-Ended Source
    Y. Rolain, Wendy Van Moer, Johan Schoukens and Rik Pintelon
    62nd ARFTG Conference Digest, Boulder, CO, December 4-5, 2003, pp. 17-24
    
39. Variance analysis of frequency response function measurements using periodic excitations
    T. D'haene, R. Pintelon, J. Schoukens and E. Van Gheem
    23rd Benelux meeting on Systems and Control, Helvoirt, The Netherlands, March 17-19, 2004
40. Reduction of the Gibbs Phenomenon in the Special Case of Non-Harmonic Time Base Distortions
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and Anouk Verheyden
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 318-321
    
41. Modified AIC and MDL Model Selection Criteria for Short Data Records
    Fjo De Ridder, Rik Pintelon, Johan Schoukens and David Paul Gilikin
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 1713-171
    
42. On the Frequency Scaling in Continuous-Time Modeling
    R. Pintelon and I. Kollár
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 1586-1589
43. Improved Approximate identification of Nonlinear Systems
    J. Schoukens, Y. Rolain and R. Pintelon
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 2183-2186
    
44. Variance analysis of frequency response function measurements using periodic excitations
    T. D'haene, R. Pintelon, J. Schoukens and E. Van Gheem
    IMTC/2004, Proceedings of the 21st IEEE Instrumentation and Measurement Technology Conference, Como, Italy, 18-20 May, 2004, pp. 1595-1600
    
45. Frequency domain identification of multivariable systems using vector orthogonal polynomials
    R. Pintelon, Y. Rolain, A. Bultheel and M. Van Barel
    Proceedings 16th International Symposium on Mathematical Theory of Networks and Systems (MTNS-2004), Leuven, Belgium, July 5-9, 2004
    
46. Identifying the main nonlinear contributions: Use of multitone excitations during circuit design
    L. De Locht, G. Vandersteen, P. Wambacq, Y. Rolain, R. Pintelon, J. Schoukens and S. Donnay
    64 ARFTG conference, Orlando, Florida, 3-4 December 2004, pp. 75-84
47. Estimating scalable common-denominator Laplace-domain MIMO models in an errors-in-variables framework
    Vandersteen G., L. De Locht, S. Jenei, Y. Rolain, R. Pintelon
    Design, Automation and Test in Europe Conference, DATE' 05, Munich, Germany, 7-11 March 2005, pp. 1076-1082
    
48. Diffusion Systems: Stability, Modeling, and Identification
    R. Pintelon, J. Schoukens, L. Pauwels, and E. Van Gheem
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 894-899
49. Leakage reduction in frequency response function measurements
    J. Schoukens, Y. Rolain, R. Pintelon
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 904-909
    
50. An Iterative Method to Stabilise a Transfer function in the s- and z-Domains
    T. D’haene, R. Pintelon, G. Vandersteen
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 666-671
    
51. Estimating Parameterized Scalable Models from the Best Linear Approximation of Nonlinear Systems for Accurate High-Level Simulations
    Ludwig De Locht, Gerd Vandersteen, Yves Rolain and Rik Pintelon
    IMTC/2005, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Ottawa, Ontario, Canada, 16-19 May, 2005, pp. 517-522
52. Initial estimates for block structured nonlinear systems with feedback
    J. Schoukens, J. Swevers, J. Paduart, D. Vaes, K. Smolders, R. Pintelon
    2005 International Symposium on Nonlinear Theory and its Applications (NOLTA 2005), Bruges, Belgium, October 18-21, 2005, pp. 622-625
53. Nonlinear State Space Modelling Of Multivariable Systems
    J. Paduart, J. Schoukens, R. Pintelon
    2005 International Symposium on Nonlinear Theory and its Applications (NOLTA 2005), Bruges, Belgium, October 18-21, 2005, pp. 614-617
    
54. Blind maximum likelihood identification of Wiener systems
    L. Vanbeylen, R. Pintelon, J. Schoukens
    25th Benelux Meeting on Systems and Control, March 13-15, 2006, Heeze, The Netherlands, pp. 62
    
55. Nonlinear State Space Modelling of Multivariable Systems
    Johan Paduart, Johan Schoukens, Rik Pintelon, Tom Coen
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 565-569
    
56. Multivariable Frequency Domain Box-Jenkins Identification
    Rik Pintelon, Patrick Guillaume, Johan Schoukens
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 208-213
    
57. Generation and Processing of Robust Periodic Excitations
    Yves Rolain, Rik Pintelon, Johan Schoukens
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 1347-1351
58. Initial Estimates for the Dynamics of a Hammerstein System
    Johan Schoukens, Widanalage Dhammika Widanage (Univ. of Warwick), Keith Richard Godfrey (Univ. of Warwick), Pintelon, Rik
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 774-777
    
59. Reliability of Parametric Variance Estimates for Identified Transfer Functions
    Johan Schoukens, Paul M.J. Van den Hof (Delft Univ. of Tech.), Rik Pintelon
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 1033-1037
    
60. Identification of Nonlinear and Linear Systems, Similarities, Differences and Challenges
    Johan Schoukens, Rik Pintelon, Yves Rolain
    14th IFAC Symposium on System Identification (SYSID 2006), March 29-31, 2006, Newcastle, Australia, pp. 122-124
61. Estimation of nonparametric noise models
    Johan Schoukens, Rik Pintelon
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 102-106
    
62. Optimizing Analog Filter Designs for Minimum Nonlinear Distortions Using Multisine Excitations
    John Lataire, Gerd Vandersteen, Rik Pintelon
    Proceedings of DATE 2007, Design, Automation and Test in Europe, Nice, France, 16-20 April, 2007
    
63. Continuous-Time Noise Modelling from Sampled Data
    R. Pintelon, J. Schoukens, P. Guillaume
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1010-1014
    
64. Passivity Enformcement of a Tranfer Function
    T. D'haene, R. Pintelon
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1468-1472
65. System Identification Approach Applied to Jitter Estimation
    F. Verbeyst, Y. Rolain, J. Schoukens, R. Pintelon
    IMTC/2006, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Sorrento, Italy, 24-27 April, 2006, pp. 1752-1757
    
66. Continuous-time operational modal analysis
    R. Pintelon, P. Guillaume, and J. Schoukens
    Proceedings of ISMA2006, International Conference on Noise and Vibration Engineering, 18-20 September, 2006, pp. 3021-3034
    
67. Nonlinear Structure Analysis using the Best Linear Approximation
    Lieve Lauwers, Johan Schoukens, Rik Pintelon and Martin Enqvist
    Proceedings of ISMA2006, International Conference on Noise and Vibration Engineering, 18-20 September, 2006, pp. 2751-2760
    
68. Enhanced Time Base Jitter Compensation of Sine Waves
    Frans Verbeyst, Yves Rolain, Johan Schoukens and Rik Pintelon
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
69. System identification approach applied to drift estimation
    Frans Verbeyst, Rik Pintelon, Yves Rolain, Johan Schoukens and Tracy Clement
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
70. Asymptotic Uncertainty of Transfer Function Estimates Using Non-Parametric Noise Models
    R. Pintelon, and M. Hong
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
71. Stable Approximations of Unstable Models
    T. D’haene, R. Pintelon, P. Guillaume
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
72. Measuring the Response of a Voltage Controlled Oscillator using the Large-Signal Network Analyser
    Yves Rolain, Wendy Van Moer, Rik Pintelon and Johan Schoukens
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
73. Some practical applications of a nonlinear block structure identification procedure
    Lieve Lauwers, Johan Schoukens, Rik Pintelon, Wendy Van Moer and Liesbeth Gomme
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
74. Application of Blind Identification to Calibration of Sensors
    Laurent Vanbeylen, Rik Pintelon and Johan Schoukens
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
75. Extending the Best Linear Approximation for Frequency Translating Systems: The Best Mixer Approximation
    Koen Vandermot, Wendy Van Moer, Yves Rolain and Rik Pintelon
    IMTC/2007, Proceedings of the IEEE Instrumentation and Measurement Technology Conference, Warsaw, Poland, May 1-3, 2007
    
76. Blind Maximum Likelihood Identification of Wiener Systems
    Laurent Vanbeylen, Rik Pintelon, Johan Schoukens
    European Control Conference 2007 Kos, Greece 2-5 July 2007
    
77. Continuous-time operational modal analysis in the presence of harmonic disturbances
    R. Pintelon, B. Peeters, P. Guillaume
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 326-331
    
78. Estimating the Dynamic Response of a Voltage Controlled Oscillator based on Large-Signal Network Analyser Measurements
    Y. Rolain, R. Pintelon, W. Van Moer and G. Vandersteen
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 432-435
    
79. Identification of a harmonic signal in the presence of additive noise, an unknown time base distortion, and an averaging effect.
    Veerle Beelaerts, Fedor De Ridder, Nele Schmitz, Maite Bauwens, Rik Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 533-535
    
80. Analysis and Modelling of Mixed-Data Systems with Frequency Translation
    L. Bos, G. Vandersteen, Y. Rolain, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 542-546
    
81. Initial Estimates for Wiener-Hammerstein systems using the best linear approximation
    L. Lauwers, J. Schoukens, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 928-932
    
82. Estimating a non-parametric, colored noise model for linear, slowly time-varying systems
    J. Lataire, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 529-532
    
83. Non-parametric power spectrum estimation via circular overlap
    K. Barbé, J. Schoukens, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 336-341
84. Robustness issues of the equivalent linear representation of a nonlinear system
    J. Schoukens, J. Lataire, G. Vandersteen, R. Pintelon
    I2MTC/2008, Proceedings of the IEEE International Instrumentation and Measurement Technology Conference, Victoria, Vancouver, Canada, May 12-15, 2008, pp. 332-335
85. Blind maximum likelihood identification of Hammerstein systems
    L. Vanbeylen, R. Pintelon, J. Schoukens
    17th IFAC World Congress, Seoul (Korea), July 7-11, 2008, pp. 2708-2713
86. Estimating the parameters of a Rice distribution using a Bayesian approach
    Lieve Lauwers, Kurt Barbé, Wendy Van Moer and Rik Pintelon
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
87. Modeling the baseband output envelope of a Microwave detector
    Liesbeth Gommé, Yves Rolain, Johan Schoukens and Rik Pintelon
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
88. Finite record effects of the errors-in-variables estimator for linear dynamic systems
    Kurt Barbé, Rik Pintelon and Gerd Vandersteen
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
89. Estimating a Power-Scalable Linearized Model for Amplifiers
    Koen Vandermot, Yves Rolain, Gerd Vandersteen, Rik Pintelon
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
90. Extracting Information on Time-Varying Systems using Multisines
    John Lataire and Rik Pintelon
    28th Benelux Meeting on Systems and Control, Spa, Belgium, March 16-18, 2009
91. Estimating the parameters of a Rice distribution: a Bayesian approach
    Lieve Lauwers, Kurt Barbé, Wendy Van Moer and Rik Pintelon
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 114-117
92. Characterization of sigma-delta modulators using ARMAX identification methods
    G. Vandersteen, M. Jain, R. Pintelon
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1485-1489
93. Upper bounding the variations of the best linear approximation of a nonlinear system in a power sweep measurement
    J. Schoukens, T. Dobrowiecki, Y. Rolain, R. Pintelon
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1514-1519
94. Nonparametric Noise Modeling in the Presence of Exogenous Inputs
    R. Pintelon, J. Schoukens, and G. Vandersteen
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1520-1524
    
95. Finite record effects of the errors-in-variables estimator for linear dynamic systems
    Kurt Barbé, Rik Pintelon and Gerd Vandersteen
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1525-1530
96. Baseband identification and RF validation of a nonlinear feedback model for a crystal detector
    Liesbeth Gommé, Yves Rolain, Johan Schoukens and Rik Pintelon
    I2MTC 2009 - International Instrumentation and Measurement Technology Conference Singapore, 5-7 May 2009, pp. 1605-1609
97. A Power-Scalable Linearized Model for RF Power Amplifiers Starting from
    S-Parameter Measurements
    Koen Vandermot, Yves Rolain, Gerd Vandersteen, Rik Pintelon, Francesco Ferranti and Tom Dhaene
    International Microwave Symposium (IMS2009), Boston (USA), June 7-12, 2009, pp. 745-748
98. Modeling the baseband output envelope of a Microwave detector
    GOMME Liesbeth, ROLAIN YVES, SCHOUKENS JOANNES, PINTELON RIK
    73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, Massachustetts, USA, pp. 29 - 32
99. Identification of Nonlinear Feedback Systems Using a Structured Polynomial Nonlinear State Space Model
    Harnack, G., L. Lauwers, R. Pintelon, J. Schoukens
    15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 332-337
100. Multivariate continuous-time operational modal analysis in the presence of harmonic disturbances
     Pintelon, R., B. Peeters, and P. Guillaume
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 384-389
101. Extracting a non-parametric instantaneous FRF of a linear, slowly time-varying system using a multisine excitation
     Lataire, J., and R. Pintelon
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 617-622
102. Analysis of the Nonlinear Induced Variability in Linear System Identification
     J. Schoukens, K. Barbé, L. Vanbeylen, R. Pintelon
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, 634-639
103. Identification of a Wiener-Hammerstein System Using the Polynomial Nonlinear State Space Approach
     Paduart, J., L. Lauwers, R. Pintelon, and J. Schoukens
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 1080-1085
104. Modelling of Wiener-Hammerstein Systems via the Best Linear Approximation
     Lauwers, L., R. Pintelon, and J. Schoukens
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp 1098-1103
105. Bootstrapped Total Least Squares estimator using (circular) overlap for Errors-In-Variables identification
     Vandersteen, G., K. Barbé, R. Pintelon, and J. Schoukens
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp, 1568-1573
106. Blind maximum likelihood identification of Wiener systems with measurement noise
     Vanbeylen, L., R. Pintelon and P. de Groen
     15th IFAC Symposium on System Identification (SYSID 2009), July 6-8, 2009, St. Malo, France, pp. 1686-1691
107. Instantaneous Frequency Response Estimation of Time-Varying Systems using Multisine Excitations
     John Lataire and Rik Pintelon
     14th Belgian-French-German Conference on Optimization, Leuven, Belgium, September 14-18, 2009
108. A VNA based broadband loadpull for non-parametric 2-port Best Linear Approximation Modelling
     Y. Rolain, J. Schoukens, R. Pintelon, L. De Locht, G. Vandersteen
     75th ARFTG, Annaheim, California, May 23-28, 2010, pp. 34-38
109. Semi-parametric identification of parallel Hammerstein systems
     Maarten Schoukens, Yves Rolain, Rik Pintelon and Johan Schoukens
     UKACC International Conference on CONTROL 2010, Coventry, UK, 7-10 September 2010, pp 937-942
110. A simple and fast technique to evaluate the possibility of approximating a nonlinear system by a nonlinear PISPO model
     Anna Marconato, Anne Van Mulders, Rik Pintelon, Yves Rolain, Johan Schoukens
     UKACC International Conference on CONTROL 2010, Coventry, UK, 7-10 September 2010, pp. 674-679
111. Estimation of nonparametric harmonic transfer functions for linear periodically time-varying systems using periodic excitations
     Louarroudi, E., R. Pintelon, J. Lataire, and G. Vandersteen
     IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Hangzhou (China), May 10-12, 2011, pp. 699-704
112. Fast FRF measurement of multivariable systems using periodic excitations
     Pintelon, R., G. Vandersteen, J. Schoukens, and Y. Rolain
     IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Hangzhou (China), May 10-12, 2011, pp. 460-465
113. On the efficiency loss of the Local Polynomial method for single experiment MIMO Frequency Response Matrix extraction
     Vandersteen, G., D. Ugryumova, Y. Rolain, L. Delocht, R. Pintelon, and J. Schoukens
     IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Hangzhou (China), May 10-12, 2011, pp. 809-813
114. Frequency domain, parametric estimation of the evolution of the time-varying dynamics of periodically time-varying systems from noisy input-output observations
     E. Louarroudi, J. Lataire, R. Pintelon, P. Janssens, J. Swevers
     ISMA - USD2012 International Conference on Uncertainty in Structural Dynamics, 17-19 September, 2012, pp. 2785-2800
115. Flutter speed prediction based on frequency-domain identification of a time-varying system
     J. Ertveldt, J. Lataire, R. Pintelon, S. Vanlanduit
     ISMA - USD2012 International Conference on Uncertainty in Structural Dynamics, 17-19 September, 2012, pp. 3013-3024
116. FRF Measurements on Slowly Time-Varying Systems Using Multisines with Non-Uniformly Spaced Harmonics
     R. Pintelon, E. Louarroudi, and J. Lataire
     IEEE International Instrumentation and Measurement Technology Conference - I2MTC, Minneapolis (MN), USA, May 6-9, 2013, pp. 1289-1294
     

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1. FAST APPROXIMATE IDENTIFICATION OF NONLINEAR SYSTEMS
   J. Schoukens, J. Nemeth, P. Crama, Y. Rolain, R. Pintelon
   Internal note
2. Some pecularities of identification in the presence of model errors
   Rik Pintelon and Johan Schoukens
   Internal report
   
3. Uncertainty of transfer function modeling using prior estimated noise models
   R. Pintelon, J. Schoukens and Y. Rolain
   Internal report
   
4. Identification of Young's Modulus from Broadband Modal Analysis Experiments
   R. Pintelon, P. Guillaume, S. Vanlanduit, K. De Belder and Y. Rolain
   Internal report
5. Initial estimates for the dynamics of a Hammerstein system
   J. Schoukens, W.D. Widanage, K.R. Godfrey, R. Pintelon
   Internal note ELEC June 2005
   
6. Nonparametric initial estimates for Wiener-Hammerstein systems
   J. Schoukens, R. Pintelon, J. Paduart, G. Vandersteen
   Internal note ELEC June 2005
   
7. Nonlinear induced variability in linear system identification
   J. Schoukens, K. Barbé, L. Vanbeylen, R. Pintelon
   Internal note ELEC September 2008
   

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